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Misell, D L, Stroke, G W, Halioua, M (1974) Coherent and incoherent imaging in the scanning transmission electron microscope. Journal of Physics D: Applied Physics, 7. doi:10.1088/0022-3727/7/10/103

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Reference TypeJournal (article/letter/editorial)
TitleCoherent and incoherent imaging in the scanning transmission electron microscope
JournalJournal of Physics D: Applied Physics
AuthorsMisell, D LAuthor
Stroke, G WAuthor
Halioua, MAuthor
Year1974 (July 1)Volume7
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/7/10/103Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5658934Long-form Identifiermindat:1:5:5658934:0
GUID0
Full ReferenceMisell, D L, Stroke, G W, Halioua, M (1974) Coherent and incoherent imaging in the scanning transmission electron microscope. Journal of Physics D: Applied Physics, 7. doi:10.1088/0022-3727/7/10/103
Plain TextMisell, D L, Stroke, G W, Halioua, M (1974) Coherent and incoherent imaging in the scanning transmission electron microscope. Journal of Physics D: Applied Physics, 7. doi:10.1088/0022-3727/7/10/103
In(1974) Journal of Physics D: Applied Physics Vol. 7. IOP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Cowley, J M (1975) Coherent and incoherent imaging in the scanning transmission electron microscope. Journal of Physics D: Applied Physics, 8. doi:10.1088/0022-3727/8/6/001
Misell, D L (1977) Conventional and scanning transmission electron microscopy: image contrast and radiation damage. Journal of Physics D: Applied Physics, 10. 1085-1107 doi:10.1088/0022-3727/10/8/007
Misell, D L, Greenaway, A H (1974) An application of the Hilbert transform in electron microscopy: I. Bright-field microscopy. Journal of Physics D: Applied Physics, 7. 832-855 doi:10.1088/0022-3727/7/6/311
Misell, D L (1974) A reply to Saxton's letter on `Phase determination in bright-field electron microscopy using complementary half-plane apertures'. Journal of Physics D: Applied Physics, 7. doi:10.1088/0022-3727/7/6/102
Misell, D L, Childs, P A (1972) Deconvolution in two dimensions with particular reference to the electron microscope. Journal of Physics D: Applied Physics, 5. 1760-1768 doi:10.1088/0022-3727/5/10/304
Misell, D L, Greenaway, A H (1974) An application of the Hilbert transform in electron microscopy: II. Non-iterative solution in bright-field microscopy and the dark-field problem. Journal of Physics D: Applied Physics, 7. 1660-1669 doi:10.1088/0022-3727/7/12/312
Misell, D L, Burge, R E, Greenaway, A H (1974) Phase determination from image intensity measurements in bright-field optics. Journal of Physics D: Applied Physics, 7. doi:10.1088/0022-3727/7/2/101
Misell, D L (1976) On the validity of the weak-phase and other approximations in the analysis of electron microscope images. Journal of Physics D: Applied Physics, 9. 1849-1866 doi:10.1088/0022-3727/9/13/006
Robinson, V N E (1974) The origins of the secondary electron signal in scanning electron microscopy. Journal of Physics D: Applied Physics, 7. 2169-2173 doi:10.1088/0022-3727/7/16/304
Fukushima, K, Kawakatsu, H, Fukami, A (1974) Fresnel fringes in electron microscope images. Journal of Physics D: Applied Physics, 7. 257-266 doi:10.1088/0022-3727/7/2/310
Misell, D L (1973) On the electron microscopy of biological specimens. Journal of Physics D: Applied Physics, 6. doi:10.1088/0022-3727/6/1/101
 
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