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Misell, D L (1977) Conventional and scanning transmission electron microscopy: image contrast and radiation damage. Journal of Physics D: Applied Physics, 10. 1085-1107 doi:10.1088/0022-3727/10/8/007

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Reference TypeJournal (article/letter/editorial)
TitleConventional and scanning transmission electron microscopy: image contrast and radiation damage
JournalJournal of Physics D: Applied Physics
AuthorsMisell, D LAuthor
Year1977 (June 1)Volume10
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/10/8/007Search in ResearchGate
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Mindat Ref. ID5660156Long-form Identifiermindat:1:5:5660156:3
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Full ReferenceMisell, D L (1977) Conventional and scanning transmission electron microscopy: image contrast and radiation damage. Journal of Physics D: Applied Physics, 10. 1085-1107 doi:10.1088/0022-3727/10/8/007
Plain TextMisell, D L (1977) Conventional and scanning transmission electron microscopy: image contrast and radiation damage. Journal of Physics D: Applied Physics, 10. 1085-1107 doi:10.1088/0022-3727/10/8/007
In(1977) Journal of Physics D: Applied Physics Vol. 10. IOP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Turner, J N, Parsons, D F, Misell, D L (1977) Electron image contrast from carbonaceous material: a comparison of theory with experiment. Journal of Physics D: Applied Physics, 10. 25-32 doi:10.1088/0022-3727/10/1/003
Misell, D L, Stroke, G W, Halioua, M (1974) Coherent and incoherent imaging in the scanning transmission electron microscope. Journal of Physics D: Applied Physics, 7. doi:10.1088/0022-3727/7/10/103
Misell, D L (1973) Image resolution in high-voltage electron microscopy. Journal of Physics D: Applied Physics, 6. 1409-1420 doi:10.1088/0022-3727/6/12/303
Childs, P A, Misell, D L (1973) Some aspects of image deconvolution in electron microscopy. Journal of Physics D: Applied Physics, 6. 1653-1663 doi:10.1088/0022-3727/6/14/301
Hussain, L A, Northrop, D C (1975) Electron radiation damage in diffused silicon solar cells. Journal of Physics D: Applied Physics, 8. 1104-1107 doi:10.1088/0022-3727/8/9/015
Misell, D L (1973) On the electron microscopy of biological specimens. Journal of Physics D: Applied Physics, 6. doi:10.1088/0022-3727/6/1/101
Agarwal, M K, Patel, T C, Patel, H B (1977) The transmission electron microscopy of MoSe2single crystals. Journal of Physics D: Applied Physics, 10. 887-889 doi:10.1088/0022-3727/10/6/011
Misell, D L (1973) A method for the solution of the phase problem in electron microscopy. Journal of Physics D: Applied Physics, 6. doi:10.1088/0022-3727/6/1/102
Misell, D L, Childs, P A (1972) Deconvolution in two dimensions with particular reference to the electron microscope. Journal of Physics D: Applied Physics, 5. 1760-1768 doi:10.1088/0022-3727/5/10/304
Misell, D L, Greenaway, A H (1974) An application of the Hilbert transform in electron microscopy: I. Bright-field microscopy. Journal of Physics D: Applied Physics, 7. 832-855 doi:10.1088/0022-3727/7/6/311
White, J R (1977) A line-width correction procedure for electron image measurements. Journal of Physics D: Applied Physics, 10. 831-844 doi:10.1088/0022-3727/10/6/005
 
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