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Kiss, L B (1986) Fluctuations in the optical reflection originating from the 1/f and other conductivity noises and some new noise-measurement principles. Journal of Physics D: Applied Physics, 19. doi:10.1088/0022-3727/19/7/003

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Reference TypeJournal (article/letter/editorial)
TitleFluctuations in the optical reflection originating from the 1/f and other conductivity noises and some new noise-measurement principles
JournalJournal of Physics D: Applied Physics
AuthorsKiss, L BAuthor
Year1986 (July 14)Volume19
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/19/7/003Search in ResearchGate
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Mindat Ref. ID5662711Long-form Identifiermindat:1:5:5662711:8
GUID0
Full ReferenceKiss, L B (1986) Fluctuations in the optical reflection originating from the 1/f and other conductivity noises and some new noise-measurement principles. Journal of Physics D: Applied Physics, 19. doi:10.1088/0022-3727/19/7/003
Plain TextKiss, L B (1986) Fluctuations in the optical reflection originating from the 1/f and other conductivity noises and some new noise-measurement principles. Journal of Physics D: Applied Physics, 19. doi:10.1088/0022-3727/19/7/003
In(1986) Journal of Physics D: Applied Physics Vol. 19. IOP Publishing

See Also

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Simon, P, Kiss, L B (1987) Phase fluctuations at optical reflection due to conductivity noises and their influence on a gaussian beam. Journal of Physics D: Applied Physics, 20. 242-243 doi:10.1088/0022-3727/20/2/017
Williams, D, Davis, L E (1986) Switching results for bistable chiral smectic cells. Journal of Physics D: Applied Physics, 19. doi:10.1088/0022-3727/19/12/003
Jones, B K, Francis, J D (1975) Direct correlation between 1/f and other noise sources. Journal of Physics D: Applied Physics, 8. 1172-1176 doi:10.1088/0022-3727/8/10/003
Ashton, L J, Hawkes, J F B (1986) Cathodoluminescence in thin zinc sulphide films. Journal of Physics D: Applied Physics, 19. 1343-1352 doi:10.1088/0022-3727/19/7/023
Johnson, P J, Clark, C D, Artus, R G C (1986) The determination of electrical conductivity by thermal noise measurements. Journal of Physics D: Applied Physics, 19. 835-840 doi:10.1088/0022-3727/19/5/015
Shimozuma, M, Tagashira, H (1986) Measurement of the ionisation and attachment coefficients in monosilane and disilane. Journal of Physics D: Applied Physics, 19. doi:10.1088/0022-3727/19/9/002
Mair, G L R, Thoms, S (1986) Studies with a capillary liquid metal ion source. Journal of Physics D: Applied Physics, 19. doi:10.1088/0022-3727/19/10/003
Arivoli, T, Ramkumar, K, Satyam, M (1986) Magnetoresistors based on composites. Journal of Physics D: Applied Physics, 19. doi:10.1088/0022-3727/19/9/003
Aymami, J, Dulieu, B, Hahn, R, Haug, R (1986) MIG short-circuit welding: on the short circuit duration. Journal of Physics D: Applied Physics, 19. doi:10.1088/0022-3727/19/8/003
Inoue, N, Hirai, M, Hasegawa, T, Matsuzawa, K (1986) A new ultrasonic interferometer for velocity measurement in liquids using optical diffraction. Journal of Physics D: Applied Physics, 19. 1439-1447 doi:10.1088/0022-3727/19/8/012
Barquins, M, Roberts, A D (1986) Rubber friction variation with rate and temperature: some new observations. Journal of Physics D: Applied Physics, 19. 547-563 doi:10.1088/0022-3727/19/4/010
 
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