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Portier, X, Petford-Long, A K (1999) Electron microscopy studies of spin-valve materials. Journal of Physics D: Applied Physics, 32. doi:10.1088/0022-3727/32/16/201

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Reference TypeJournal (article/letter/editorial)
TitleElectron microscopy studies of spin-valve materials
JournalJournal of Physics D: Applied Physics
AuthorsPortier, XAuthor
Petford-Long, A KAuthor
Year1999 (August 21)Volume32
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/32/16/201Search in ResearchGate
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Mindat Ref. ID5667557Long-form Identifiermindat:1:5:5667557:7
GUID0
Full ReferencePortier, X, Petford-Long, A K (1999) Electron microscopy studies of spin-valve materials. Journal of Physics D: Applied Physics, 32. doi:10.1088/0022-3727/32/16/201
Plain TextPortier, X, Petford-Long, A K (1999) Electron microscopy studies of spin-valve materials. Journal of Physics D: Applied Physics, 32. doi:10.1088/0022-3727/32/16/201
In(1999) Journal of Physics D: Applied Physics Vol. 32. IOP Publishing

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Bennett, P A, Känel, H von (1999) Scanning tunnelling microscopy studies of silicides. Journal of Physics D: Applied Physics, 32. doi:10.1088/0022-3727/32/15/201
Portier, X., Petford-Long, A. K., Anthony, T. C., Brug, J. A. (1999) Effect of stray-field coupling on active spin-valve elements analyzed by Lorentz transmission electron microscopy. Journal of Applied Physics, 85 (8). 4120-4126 doi:10.1063/1.370320
Jonscher, Andrew K (1999) Dielectric relaxation in solids. Journal of Physics D: Applied Physics, 32. doi:10.1088/0022-3727/32/14/201
Daughton, J M, Pohm, A V, Fayfield, R T, Smith, C H (1999) Applications of spin dependent transport materials. Journal of Physics D: Applied Physics, 32. doi:10.1088/0022-3727/32/22/201
Kalinowski, Jan (1999) Electroluminescence in organics. Journal of Physics D: Applied Physics, 32. doi:10.1088/0022-3727/32/24/201
Portier, X., Petford-Long, A. K., Anthony, T. C., Brug, J. A. (1999) Temperature dependence of the reversal mechanism in spin-valve films. Applied Physics Letters, 75 (9). 1290-1292 doi:10.1063/1.124671
Portier, X., Petford-Long, A. K., Doole, R. C., Anthony, T. C., Brug, J. A. (1997) Lorentz transmission electron microscopy on NiFe/Cu/Co/NiFe/MnNi active spin valve elements. Applied Physics Letters, 71 (14). 2032-2034 doi:10.1063/1.119778
Jenkins, T E (1999) Multiple-angle-of-incidence ellipsometry. Journal of Physics D: Applied Physics, 32. doi:10.1088/0022-3727/32/9/201
Lloyd, J R (1999) Electromigration in integrated circuit conductors. Journal of Physics D: Applied Physics, 32. doi:10.1088/0022-3727/32/17/201
Choi, E K, Seo, Y (1999) Transverse properties of radiation eigenmodes in a sheet-beam free-electron laser. Journal of Physics D: Applied Physics, 32. 2044-2048 doi:10.1088/0022-3727/32/16/312
Frolov, V D, Karabutov, A V, Konov, V I, Pimenov, S M, Prokhorov, A M (1999) Scanning tunnelling microscopy: application to field electron emission studies. Journal of Physics D: Applied Physics, 32. 815-819 doi:10.1088/0022-3727/32/7/010
 
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