Lloyd, J R (1999) Electromigration in integrated circuit conductors. Journal of Physics D: Applied Physics, 32. doi:10.1088/0022-3727/32/17/201
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Electromigration in integrated circuit conductors | ||
| Journal | Journal of Physics D: Applied Physics | ||
| Authors | Lloyd, J R | Author | |
| Year | 1999 (September 7) | Volume | 32 |
| Publisher | IOP Publishing | ||
| DOI | doi:10.1088/0022-3727/32/17/201Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 5667584 | Long-form Identifier | mindat:1:5:5667584:1 |
| GUID | 0 | ||
| Full Reference | Lloyd, J R (1999) Electromigration in integrated circuit conductors. Journal of Physics D: Applied Physics, 32. doi:10.1088/0022-3727/32/17/201 | ||
| Plain Text | Lloyd, J R (1999) Electromigration in integrated circuit conductors. Journal of Physics D: Applied Physics, 32. doi:10.1088/0022-3727/32/17/201 | ||
| In | (1999) Journal of Physics D: Applied Physics Vol. 32. IOP Publishing | ||
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