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Dudley, Michael, Huang, XianRong, Vetter, William M (2003) Contribution of x-ray topography and high-resolution diffraction to the study of defects in SiC. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/307

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Reference TypeJournal (article/letter/editorial)
TitleContribution of x-ray topography and high-resolution diffraction to the study of defects in SiC
JournalJournal of Physics D: Applied Physics
AuthorsDudley, MichaelAuthor
Huang, XianRongAuthor
Vetter, William MAuthor
Year2003 (May 21)Volume36
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/36/10a/307Search in ResearchGate
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Mindat Ref. ID5669541Long-form Identifiermindat:1:5:5669541:0
GUID0
Full ReferenceDudley, Michael, Huang, XianRong, Vetter, William M (2003) Contribution of x-ray topography and high-resolution diffraction to the study of defects in SiC. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/307
Plain TextDudley, Michael, Huang, XianRong, Vetter, William M (2003) Contribution of x-ray topography and high-resolution diffraction to the study of defects in SiC. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/307
In(2002) Journal of Physics D: Applied Physics Vol. 36. IOP Publishing

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(2003) Guest Editor's Introduction: Special issue on x-ray imaging and high-resolution diffraction. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/701
Bowen, D K, Wormington, M, Feichtinger, P (2003) A novel digital x-ray topography system. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/305
Bastie, P, Dolino, G, Hamelin, B (2003) Opalescence of quartz: a study by high energy x-ray diffraction. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/328
Dudley, Michael, Huang, X., Vetter, William M., Neudeck, Philip G. (2003) Synchrotron White Beam X-Ray Topography and High Resolution Triple Axis X-Ray Diffraction Studies of Defects in SiC Substrates, Epilayers and Devices. Materials Science Forum, 433. 247-252 doi:10.4028/www.scientific.net/msf.433-436.247
Shilo, D, Zolotoyabko, E (2003) Visualization of short surface acoustic waves by stroboscopic x-ray topography: analysis of contrast. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/325
Gronkowski, J (2001) Guest Editor's introduction: Special issue on high resolution x-ray diffraction and topography. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/001
Wieteska, K, Wierzchowski, W, Graeff, W, Lefeld-Sosnowska, M, Regulska, M (2003) Bragg-case section topography of growth defects in Si : Ge crystals. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/327
Fodchuk, I M, Raransky, N D (2003) Moir  images simulation of strains in x-ray interferometry. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/311
Godwod, K, ymierska, D, Auleytner, J (2003) Mathematical analysis of the high-resolution reciprocal space map. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/330
Argunova, T S, Sorokin, L M, Pevzner, B Z, Je, J H, Hwu, Y, Tsai, W-L (2003) X-ray imaging study of lattice defects related to diffusion of helium in quartz. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/304
Solak, H H, David, C, Gobrecht, J, Drakopoulos, M (2003) Development of x-ray topographic microscopy for the study of electromigration in interconnects. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/326
 
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