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Argunova, T S, Sorokin, L M, Pevzner, B Z, Je, J H, Hwu, Y, Tsai, W-L (2003) X-ray imaging study of lattice defects related to diffusion of helium in quartz. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/304

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Reference TypeJournal (article/letter/editorial)
TitleX-ray imaging study of lattice defects related to diffusion of helium in quartz
JournalJournal of Physics D: Applied Physics
AuthorsArgunova, T SAuthor
Sorokin, L MAuthor
Pevzner, B ZAuthor
Je, J HAuthor
Hwu, YAuthor
Tsai, W-LAuthor
Year2003 (May 21)Volume36
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/36/10a/304Search in ResearchGate
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Mindat Ref. ID5669538Long-form Identifiermindat:1:5:5669538:6
GUID0
Full ReferenceArgunova, T S, Sorokin, L M, Pevzner, B Z, Je, J H, Hwu, Y, Tsai, W-L (2003) X-ray imaging study of lattice defects related to diffusion of helium in quartz. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/304
Plain TextArgunova, T S, Sorokin, L M, Pevzner, B Z, Je, J H, Hwu, Y, Tsai, W-L (2003) X-ray imaging study of lattice defects related to diffusion of helium in quartz. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/304
In(2002) Journal of Physics D: Applied Physics Vol. 36. IOP Publishing

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Argunova, T. S., Sorokin, L. M., Pevzner, B. Z., Balitskii, V. S., Gannibal, M. A., Je, J. H., Hwu, Y., Tsai, W. -L. (2003) The influence of defects in the crystal structure on helium diffusion in quartz. Physics of the Solid State, 45. 1910-1917 doi:10.1134/1.1620094
Bastie, P, Dolino, G, Hamelin, B (2003) Opalescence of quartz: a study by high energy x-ray diffraction. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/328
Thi, H Nguyen, Jamgotchian, H, Gastaldi, J, H rtwig, J, Schenk, T, Klein, H, Billia, B, Baruchel, J, Dabo, Y (2003) Preliminaryin situand real-time study of directional solidification of metallic alloys by x-ray imaging techniques. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/317
Dudley, Michael, Huang, XianRong, Vetter, William M (2003) Contribution of x-ray topography and high-resolution diffraction to the study of defects in SiC. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/307
Kyutt, R N, Shubina, T V, Sorokin, S V, Solnyshkov, D D, Ivanov, S V, Willander, M (2003) X-ray diffraction determination of the interface structure of CdSe/BeTe superlattices. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/334
Solak, H H, David, C, Gobrecht, J, Drakopoulos, M (2003) Development of x-ray topographic microscopy for the study of electromigration in interconnects. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/326
(2003) Guest Editor's Introduction: Special issue on x-ray imaging and high-resolution diffraction. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/701
Gutkin, M. Yu., Sheinerman, A. G., Argunova, T. S., Je, J. H., Kang, H. S., Hwu, Y., Tsai, W.-L. (2002) Ramification of micropipes in SiC crystals. Journal of Applied Physics, 92 (2). 889-894 doi:10.1063/1.1488247
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Hatton, Peter D, Wilkins, S B, Spencer, P D, Zimmermann, M v, d'Almeida, T (2003) High energy x-ray scattering studies of strongly correlated oxides. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/332
Zymierska, D, Godwod, K, Auleytner, J (2003) X-ray diffractometric study of polycrystalline precipitates within a single crystal matrix. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/341
 
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