Ma, Zhen-Yang, Chai, Chang-Chun, Ren, Xing-Rong, Yang, Yin-Tang, Chen, Bin, Song, Kun, Zhao, Ying-Bo (2012) Microwave damage susceptibility trend of a bipolar transistor as a function of frequency. Chinese Physics B, 21. 98502pp. doi:10.1088/1674-1056/21/9/098502
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Microwave damage susceptibility trend of a bipolar transistor as a function of frequency | ||
| Journal | Chinese Physics B | ||
| Authors | Ma, Zhen-Yang | Author | |
| Chai, Chang-Chun | Author | ||
| Ren, Xing-Rong | Author | ||
| Yang, Yin-Tang | Author | ||
| Chen, Bin | Author | ||
| Song, Kun | Author | ||
| Zhao, Ying-Bo | Author | ||
| Year | 2012 (September) | Volume | 21 |
| Publisher | IOP Publishing | ||
| DOI | doi:10.1088/1674-1056/21/9/098502Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 6002927 | Long-form Identifier | mindat:1:5:6002927:0 |
| GUID | 0 | ||
| Full Reference | Ma, Zhen-Yang, Chai, Chang-Chun, Ren, Xing-Rong, Yang, Yin-Tang, Chen, Bin, Song, Kun, Zhao, Ying-Bo (2012) Microwave damage susceptibility trend of a bipolar transistor as a function of frequency. Chinese Physics B, 21. 98502pp. doi:10.1088/1674-1056/21/9/098502 | ||
| Plain Text | Ma, Zhen-Yang, Chai, Chang-Chun, Ren, Xing-Rong, Yang, Yin-Tang, Chen, Bin, Song, Kun, Zhao, Ying-Bo (2012) Microwave damage susceptibility trend of a bipolar transistor as a function of frequency. Chinese Physics B, 21. 98502pp. doi:10.1088/1674-1056/21/9/098502 | ||
| In | (n.d.) Chinese Physics B Vol. 21. IOP Publishing | ||
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