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Zhang, Xian-Jun, Yang, Yin-Tang, Duan, Bao-Xing, Chai, Chang-Chun, Song, Kun, Chen, Bin (2012) Drain-induced barrier lowering effect for short channel dual material gate 4H silicon carbide metal—semiconductor field-effect transistor. Chinese Physics B, 21. 97302pp. doi:10.1088/1674-1056/21/9/097302

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Reference TypeJournal (article/letter/editorial)
TitleDrain-induced barrier lowering effect for short channel dual material gate 4H silicon carbide metal—semiconductor field-effect transistor
JournalChinese Physics B
AuthorsZhang, Xian-JunAuthor
Yang, Yin-TangAuthor
Duan, Bao-XingAuthor
Chai, Chang-ChunAuthor
Song, KunAuthor
Chen, BinAuthor
Year2012 (September)Volume21
PublisherIOP Publishing
DOIdoi:10.1088/1674-1056/21/9/097302Search in ResearchGate
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Mindat Ref. ID6002906Long-form Identifiermindat:1:5:6002906:7
GUID0
Full ReferenceZhang, Xian-Jun, Yang, Yin-Tang, Duan, Bao-Xing, Chai, Chang-Chun, Song, Kun, Chen, Bin (2012) Drain-induced barrier lowering effect for short channel dual material gate 4H silicon carbide metal—semiconductor field-effect transistor. Chinese Physics B, 21. 97302pp. doi:10.1088/1674-1056/21/9/097302
Plain TextZhang, Xian-Jun, Yang, Yin-Tang, Duan, Bao-Xing, Chai, Chang-Chun, Song, Kun, Chen, Bin (2012) Drain-induced barrier lowering effect for short channel dual material gate 4H silicon carbide metal—semiconductor field-effect transistor. Chinese Physics B, 21. 97302pp. doi:10.1088/1674-1056/21/9/097302
In(n.d.) Chinese Physics B Vol. 21. IOP Publishing


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