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Su, Shuai, Jian, Xiao-Chuan, Wang, Fang, Han, Ye-Mei, Tian, Yu-Xian, Wang, Xiao-Yang, Zhang, Hong-Zhi, Zhang, Kai-Liang (2016) Resistive switching characteristic and uniformity of low-power HfO x -based resistive random access memory with the BN insertion layer. Chinese Physics B, 25. 107302pp. doi:10.1088/1674-1056/25/10/107302

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Reference TypeJournal (article/letter/editorial)
TitleResistive switching characteristic and uniformity of low-power HfO x -based resistive random access memory with the BN insertion layer
JournalChinese Physics B
AuthorsSu, ShuaiAuthor
Jian, Xiao-ChuanAuthor
Wang, FangAuthor
Han, Ye-MeiAuthor
Tian, Yu-XianAuthor
Wang, Xiao-YangAuthor
Zhang, Hong-ZhiAuthor
Zhang, Kai-LiangAuthor
Year2016 (October)Volume25
PublisherIOP Publishing
DOIdoi:10.1088/1674-1056/25/10/107302Search in ResearchGate
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Mindat Ref. ID6006789Long-form Identifiermindat:1:5:6006789:0
GUID0
Full ReferenceSu, Shuai, Jian, Xiao-Chuan, Wang, Fang, Han, Ye-Mei, Tian, Yu-Xian, Wang, Xiao-Yang, Zhang, Hong-Zhi, Zhang, Kai-Liang (2016) Resistive switching characteristic and uniformity of low-power HfO x -based resistive random access memory with the BN insertion layer. Chinese Physics B, 25. 107302pp. doi:10.1088/1674-1056/25/10/107302
Plain TextSu, Shuai, Jian, Xiao-Chuan, Wang, Fang, Han, Ye-Mei, Tian, Yu-Xian, Wang, Xiao-Yang, Zhang, Hong-Zhi, Zhang, Kai-Liang (2016) Resistive switching characteristic and uniformity of low-power HfO x -based resistive random access memory with the BN insertion layer. Chinese Physics B, 25. 107302pp. doi:10.1088/1674-1056/25/10/107302
In(n.d.) Chinese Physics B Vol. 25. IOP Publishing


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