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Yu, Jun-Ting, Chen, Shu-Ming, Chen, Jian-Jun, Huang, Peng-Cheng, Song, Rui-Qiang (2016) Effect of supply voltage and body-biasing on single-event transient pulse quenching in bulk fin field-effect-transistor process. Chinese Physics B, 25. 49401pp. doi:10.1088/1674-1056/25/4/049401

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Reference TypeJournal (article/letter/editorial)
TitleEffect of supply voltage and body-biasing on single-event transient pulse quenching in bulk fin field-effect-transistor process
JournalChinese Physics B
AuthorsYu, Jun-TingAuthor
Chen, Shu-MingAuthor
Chen, Jian-JunAuthor
Huang, Peng-ChengAuthor
Song, Rui-QiangAuthor
Year2016 (April)Volume25
PublisherIOP Publishing
DOIdoi:10.1088/1674-1056/25/4/049401Search in ResearchGate
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Mindat Ref. ID6007268Long-form Identifiermindat:1:5:6007268:9
GUID0
Full ReferenceYu, Jun-Ting, Chen, Shu-Ming, Chen, Jian-Jun, Huang, Peng-Cheng, Song, Rui-Qiang (2016) Effect of supply voltage and body-biasing on single-event transient pulse quenching in bulk fin field-effect-transistor process. Chinese Physics B, 25. 49401pp. doi:10.1088/1674-1056/25/4/049401
Plain TextYu, Jun-Ting, Chen, Shu-Ming, Chen, Jian-Jun, Huang, Peng-Cheng, Song, Rui-Qiang (2016) Effect of supply voltage and body-biasing on single-event transient pulse quenching in bulk fin field-effect-transistor process. Chinese Physics B, 25. 49401pp. doi:10.1088/1674-1056/25/4/049401
In(n.d.) Chinese Physics B Vol. 25. IOP Publishing

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