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Beck, N., Meier, J., Fric, J., Remeš, Z., Poruba, A., Flückiger, R., Pohl, J., Shah, A., Vaněček, M. (1996) Enhanced optical absorption in microcrystalline silicon. Journal of Non-Crystalline Solids, 198. 903-906 doi:10.1016/0022-3093(96)00080-4

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Reference TypeJournal (article/letter/editorial)
TitleEnhanced optical absorption in microcrystalline silicon
JournalJournal of Non-Crystalline Solids
AuthorsBeck, N.Author
Meier, J.Author
Fric, J.Author
Remeš, Z.Author
Poruba, A.Author
Flückiger, R.Author
Pohl, J.Author
Shah, A.Author
Vaněček, M.Author
Year1996 (May)Volume198
PublisherElsevier BV
DOIdoi:10.1016/0022-3093(96)00080-4Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID635565Long-form Identifiermindat:1:5:635565:8
GUID0
Full ReferenceBeck, N., Meier, J., Fric, J., Remeš, Z., Poruba, A., Flückiger, R., Pohl, J., Shah, A., Vaněček, M. (1996) Enhanced optical absorption in microcrystalline silicon. Journal of Non-Crystalline Solids, 198. 903-906 doi:10.1016/0022-3093(96)00080-4
Plain TextBeck, N., Meier, J., Fric, J., Remeš, Z., Poruba, A., Flückiger, R., Pohl, J., Shah, A., Vaněček, M. (1996) Enhanced optical absorption in microcrystalline silicon. Journal of Non-Crystalline Solids, 198. 903-906 doi:10.1016/0022-3093(96)00080-4
In(1996) Journal of Non-Crystalline Solids Vol. 198. Elsevier BV

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Vaněček, M., Poruba, A., Remeš, Z., Rosa, J., Kamba, S., Vorlı́ček, V., Meier, J., Shah, A. (2000) Electron spin resonance and optical characterization of defects in microcrystalline silicon. Journal of Non-Crystalline Solids, 266. 519-523 doi:10.1016/s0022-3093(99)00804-2
Vaněček, M., Poruba, A., Remeš, Z., Beck, N., Nesládek, M. (1998) Optical properties of microcrystalline materials. Journal of Non-Crystalline Solids, 227. 967-972 doi:10.1016/s0022-3093(98)00202-6
Poruba, A, Vaněček, M, Meier, J, Shah, A (2002) Fourier transform infrared photocurrent spectroscopy in microcrystalline silicon. Journal of Non-Crystalline Solids, 299. 536-540 doi:10.1016/s0022-3093(01)01022-5
Vaněček, M., Fric, J., Poruba, A., Mahan, A.H., Crandall, R.S. (1996) Influence of annealing above the deposition temperature on metastability in amorphous silicon. Journal of Non-Crystalline Solids, 198. 478-481 doi:10.1016/0022-3093(95)00742-3
Poruba, A., Fejfar, A., Remeš, Z., Špringer, J., Vaněček, M., Kočka, J., Meier, J., Torres, P., Shah, A. (2000) Optical absorption and light scattering in microcrystalline silicon thin films and solar cells. Journal of Applied Physics, 88 (1). 148-160 doi:10.1063/1.373635
Poruba, A., Springer, J., Mullerova, L., Beitlerova, A., Vaněček, M., Wyrsch, N., Shah, A. (2004) Temperature dependence of the optical absorption coefficient of microcrystalline silicon. Journal of Non-Crystalline Solids, 338. 222-227 doi:10.1016/j.jnoncrysol.2004.02.058
Fejfar, A., Beck, N., Stuchlı́ková, H., Wyrsch, N., Torres, P., Meier, J., Shah, A., Kočka, J. (1998) On the transport properties of microcrystalline silicon. Journal of Non-Crystalline Solids, 227. 1006-1010 doi:10.1016/s0022-3093(98)00275-0
Fejfar, A., Poruba, A., Vaněček, M., Kočka, J. (1996) Precise measurement of the deep defects and surface states in a-Si:H films by absolute CPM. Journal of Non-Crystalline Solids, 198. 304-308 doi:10.1016/0022-3093(95)00692-3
Wyrsch, N, Feitknecht, L, Droz, C, Torres, P, Shah, A, Poruba, A, Vaněček, M (2000) Hydrogenated microcrystalline silicon: how to correlate layer properties and solar cell performance. Journal of Non-Crystalline Solids, 266. 1099-1103 doi:10.1016/s0022-3093(99)00910-2
Vieira, M., Fantoni, A., Koynov, S., Cruz, J., Maçarico, A., Martins, R. (1996) Amorphous and microcrystalline silicon p-i-n optical speed sensors based on the flying spot technique. Journal of Non-Crystalline Solids, 198. 1193-1197 doi:10.1016/0022-3093(96)00111-1
Holovský, J., Poruba, A., Purkrt, A., Remeš, Z., Vaněček, M. (2008) Comparison of photocurrent spectra measured by FTPS and CPM for amorphous silicon layers and solar cells. Journal of Non-Crystalline Solids, 354 (19) 2167-2170 doi:10.1016/j.jnoncrysol.2007.09.106
 
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