Rubinelli, F.A., Stolk, R.L., Sturiale, A., Rath, J.K., Schropp, R.E.I. (2006) Sensitivity of the dark spectral response of thin film silicon based tandem solar cells on the defective regions in the intrinsic layers. Journal of Non-Crystalline Solids, 352 (9) 1876-1879 doi:10.1016/j.jnoncrysol.2006.02.014
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Sensitivity of the dark spectral response of thin film silicon based tandem solar cells on the defective regions in the intrinsic layers | ||
Journal | Journal of Non-Crystalline Solids | ||
Authors | Rubinelli, F.A. | Author | |
Stolk, R.L. | Author | ||
Sturiale, A. | Author | ||
Rath, J.K. | Author | ||
Schropp, R.E.I. | Author | ||
Year | 2006 (June) | Volume | 352 |
Issue | 9 | ||
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.jnoncrysol.2006.02.014Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 644502 | Long-form Identifier | mindat:1:5:644502:1 |
GUID | 0 | ||
Full Reference | Rubinelli, F.A., Stolk, R.L., Sturiale, A., Rath, J.K., Schropp, R.E.I. (2006) Sensitivity of the dark spectral response of thin film silicon based tandem solar cells on the defective regions in the intrinsic layers. Journal of Non-Crystalline Solids, 352 (9) 1876-1879 doi:10.1016/j.jnoncrysol.2006.02.014 | ||
Plain Text | Rubinelli, F.A., Stolk, R.L., Sturiale, A., Rath, J.K., Schropp, R.E.I. (2006) Sensitivity of the dark spectral response of thin film silicon based tandem solar cells on the defective regions in the intrinsic layers. Journal of Non-Crystalline Solids, 352 (9) 1876-1879 doi:10.1016/j.jnoncrysol.2006.02.014 | ||
In | (2006, June) Journal of Non-Crystalline Solids Vol. 352 (9) Elsevier BV |
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