(1994, August) Surface and Interface Analysis Vol. 21 (8) Wiley

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Reference Type	Journal (issue)
Journal	Surface and Interface Analysis
Year	1994 (August)	Volume	21
Issue	< 8 >
Publisher	Wiley
Mindat Ref. ID	6504648	Long-form Identifier	mindat:1:5:6504648:5
GUID	0
Full Reference	(1994, August) Surface and Interface Analysis Vol. 21 (8) Wiley
Plain Text	(1994, August) Surface and Interface Analysis Vol. 21 (8) Wiley
In	(n.d.) Surface and Interface Analysis Vol. 21. Wiley

Contains

	*(1994) Masthead. Surface and Interface Analysis, 21 (8). doi:10.1002/sia.740210801*
	Kooi, Bart J., Somers, Marcel A. J. (1994) Factor analysis of Fe M2,3 VV spectra of oxidizing iron: The role of the background in the emergence of ghost components. Surface and Interface Analysis, 21 (8). 501-513 doi:10.1002/sia.740210802
	Hoppe, H.-W., Haupt, S., Strehblow, H.-H. (1994) Combined surface analytical and electrochemical study of the formation of passive layers on Fe/Cr alloys in 1M NaOH. Surface and Interface Analysis, 21 (8). 514-525 doi:10.1002/sia.740210803
	Voigt, S., Szargan, R., Suoninen, E. (1994) Interaction of copper(II) ions with pyrite and its influence on ethyl xanthate adsorption. Surface and Interface Analysis, 21 (8). 526-536 doi:10.1002/sia.740210804
	Werner, Wolfgang S. M., Tilinin, Igor S., Beilschmidt, Herbert, Hayek, Markus (1994) Simultaneous background subtraction and depth profile determination from AES/XPS measurements. Surface and Interface Analysis, 21 (8). 537-545 doi:10.1002/sia.740210805
	Csanàdy, A., Pitton, Y., Mathieu, H. J., Kessler, K., Fuchs, R., Textor, M. (1994) Preparation of thin AlOx (0 ≤x ≤ 1.5) films on gold and polycarbonate characterized by XPS, EPMA, AFM and TEM. Surface and Interface Analysis, 21 (8). 546-552 doi:10.1002/sia.740210806
	Burrell, Michael C., Bhatia, Qamar S., Michael, R. S. (1994) XPS and static SIMS studies of copoly(ether-esters) containing mixed polyether soft blocks. Surface and Interface Analysis, 21 (8). 553-559 doi:10.1002/sia.740210807
	Zalar, A., Hofmann, S., Pimentel, F., Panjan, P. (1994) Interfacial reactions and silicide formation in Si/Ni/Si and Si/Cr/Si sandwich layers. Surface and Interface Analysis, 21 (8). 560-565 doi:10.1002/sia.740210808
	*Zehnpfenning, J., Niehuis, E., Rulle, H., Benninghoven, A. (1994) Effect of Ga+ backscattering in static SIMS. Surface and Interface Analysis, 21 (8). 566-570 doi:10.1002/sia.740210809*
	*Calliari, L., Gonzo, L., Micheli, V., Tiscione, P. (1994) Auger quantitative analysis of brass via target factor analysis. Surface and Interface Analysis, 21 (8). 571-575 doi:10.1002/sia.740210810*
	Andersen, J. E. T., Warren, J. P., Zhang, X., Lambert, R. M. (1994) Determination of surface stoichiometry in polycrystalline alloys by a crystallographic electron attenuation model: Application to the Ce/Rh system. Surface and Interface Analysis, 21 (8). 576-580 doi:10.1002/sia.740210811
	Reid, Gregor, Davidson, Ross, Denstedt, John D. (1994) XPS, SEM and EDX analysis of conditioning film deposition onto ureteral stents. Surface and Interface Analysis, 21 (8). 581-586 doi:10.1002/sia.740210812
	Seah, M. P. (1994) Comment on ‘neglected and hidden errors in the quantification of Auger electron spectroscopy’ by J. du plessis (Surf. Interface Anal. 20, 228 (1993)). Surface and Interface Analysis, 21 (8). 587-589 doi:10.1002/sia.740210813
	Du Plessis, J. (1994) Reply to comment on ‘neglected and hidden errors in the quantification of Auger electron spectroscopy’ by J. du plessis (Surf. Interface Anal. 20, 228 (1993)). Surface and Interface Analysis, 21 (8). 590-591 doi:10.1002/sia.740210814
	*(1994) Forthcoming events. Surface and Interface Analysis, 21 (8). 592 doi:10.1002/sia.740210815*
	*(1994) Recently accepted papers. Surface and Interface Analysis, 21 (8). 593 doi:10.1002/sia.740210816*

	*(1986, August) Surface and Interface Analysis* Vol. 8 (4) Wiley**
	*(1989, August) Surface and Interface Analysis* Vol. 14 (8) Wiley**
	*(1990, August) Surface and Interface Analysis* Vol. 15 (8) Wiley**
	*(1992, August) Surface and Interface Analysis* Vol. 18 (8) Wiley**
	*(1996, August) Surface and Interface Analysis* Vol. 24 (8) Wiley**
	*(1999, August) Surface and Interface Analysis* Vol. 27 (8) Wiley**
	*(2000, August) Surface and Interface Analysis* Vol. 29 (8) Wiley**
	*(2001, August) Surface and Interface Analysis* Vol. 31 (8) Wiley**
	*(2002, August) Surface and Interface Analysis* Vol. 33 (8) Wiley**
	*(2003, August) Surface and Interface Analysis* Vol. 35 (8) Wiley**
	*(2004, August) Surface and Interface Analysis* Vol. 36 (8) Wiley**

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(1994, August) Surface and Interface Analysis Vol. 21 (8) Wiley

Contains

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