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Werner, Wolfgang S. M., Tilinin, Igor S., Beilschmidt, Herbert, Hayek, Markus (1994) Simultaneous background subtraction and depth profile determination from AES/XPS measurements. Surface and Interface Analysis, 21 (8). 537-545 doi:10.1002/sia.740210805

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Reference TypeJournal (article/letter/editorial)
TitleSimultaneous background subtraction and depth profile determination from AES/XPS measurements
JournalSurface and Interface Analysis
AuthorsWerner, Wolfgang S. M.Author
Tilinin, Igor S.Author
Beilschmidt, HerbertAuthor
Hayek, MarkusAuthor
Year1994 (August)Volume21
Issue8
PublisherWiley
DOIdoi:10.1002/sia.740210805Search in ResearchGate
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Mindat Ref. ID6504657Long-form Identifiermindat:1:5:6504657:3
GUID0
Full ReferenceWerner, Wolfgang S. M., Tilinin, Igor S., Beilschmidt, Herbert, Hayek, Markus (1994) Simultaneous background subtraction and depth profile determination from AES/XPS measurements. Surface and Interface Analysis, 21 (8). 537-545 doi:10.1002/sia.740210805
Plain TextWerner, Wolfgang S. M., Tilinin, Igor S., Beilschmidt, Herbert, Hayek, Markus (1994) Simultaneous background subtraction and depth profile determination from AES/XPS measurements. Surface and Interface Analysis, 21 (8). 537-545 doi:10.1002/sia.740210805
In(1994, August) Surface and Interface Analysis Vol. 21 (8) Wiley

See Also

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Beilschmidt, Herbert, Tiliuin, Igor S., Werner, Wolfgang S. M. (1994) Inelastic mean free path of medium energy electrons in Au, Pt, Ni and Al determined by Elastic peak electron spectroscopy. Surface and Interface Analysis, 22 (1). 120-123 doi:10.1002/sia.740220129
Werner, Wolfgang S. M., Tilinin, Igor S., Jablonski, Aleksander (1995) Efficient calculation of photoelectron angular distribution. Surface and Interface Analysis, 23 (12). 823-832 doi:10.1002/sia.740231205
Dwyer, V. M. (1993) Reconstruction of the depth profile from angle-resolved AES/XPS. Surface and Interface Analysis, 20 (8). 687-695 doi:10.1002/sia.740200813
Werner, Wolfgang S. M., Tilinin, Igor S., Hayek, Markus (1994) Angular distribution of electrons reflected elastically from noncrystalline solid surfaces. Physical Review B, 50 (7) 4819-4833 doi:10.1103/physrevb.50.4819
Werner, Wolfgang S. M. (1995) Magic angle for surface roughness for intensity ratios in AES/XPS. Surface and Interface Analysis, 23 (10). 696-704 doi:10.1002/sia.740231008
Werner, W. S. M., Smith, G. C., Livesey, A. K. (1994) Maximum entropy analysis of the effects of elastic scattering on the reconstruction of depth profiles from angle-dependent XPS measurements. Surface and Interface Analysis, 21 (1). 38-43 doi:10.1002/sia.740210106
Tougaard, S., Jørgensen, B. (1985) Absolute background determination in XPS. Surface and Interface Analysis, 7 (1). 17-21 doi:10.1002/sia.740070105
Dwyer, V. M. (1994) Incorporation of elastic scattering into composition-depth profile reconstruction from angle-resolved Auger/XPS data. Surface and Interface Analysis, 21 (9). 637-642 doi:10.1002/sia.740210907
Werner, Wolfgang S. M., Hayek, Markus (1994) Influence of the elastic scattering cross-section on angle-resolved reflection electron energy loss spectra of polycrystalline Al, Ni, Pt and Au. Surface and Interface Analysis, 22 (1). 79-83 doi:10.1002/sia.740220120
Norgren, B. S., Somers, M. A. J., De Wit, J. H. W. (1994) Application of tougaard background subtraction to XPS spectra of passivated Fe-17 Cr. Surface and Interface Analysis, 21 (6). 378-381 doi:10.1002/sia.740210609
Oswald, S., Brückner, W. (2004) XPS depth profile analysis of non-stoichiometric NiO films. Surface and Interface Analysis, 36 (1). 17-22 doi:10.1002/sia.1640
 
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