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Dwyer, V. M. (1994) Incorporation of elastic scattering into composition-depth profile reconstruction from angle-resolved Auger/XPS data. Surface and Interface Analysis, 21 (9). 637-642 doi:10.1002/sia.740210907

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Reference TypeJournal (article/letter/editorial)
TitleIncorporation of elastic scattering into composition-depth profile reconstruction from angle-resolved Auger/XPS data
JournalSurface and Interface Analysis
AuthorsDwyer, V. M.Author
Year1994 (September)Volume21
Issue9
PublisherWiley
DOIdoi:10.1002/sia.740210907Search in ResearchGate
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Mindat Ref. ID6504694Long-form Identifiermindat:1:5:6504694:4
GUID0
Full ReferenceDwyer, V. M. (1994) Incorporation of elastic scattering into composition-depth profile reconstruction from angle-resolved Auger/XPS data. Surface and Interface Analysis, 21 (9). 637-642 doi:10.1002/sia.740210907
Plain TextDwyer, V. M. (1994) Incorporation of elastic scattering into composition-depth profile reconstruction from angle-resolved Auger/XPS data. Surface and Interface Analysis, 21 (9). 637-642 doi:10.1002/sia.740210907
In(1994, September) Surface and Interface Analysis Vol. 21 (9) Wiley

See Also

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Dwyer, V. M. (1993) Reconstruction of the depth profile from angle-resolved AES/XPS. Surface and Interface Analysis, 20 (8). 687-695 doi:10.1002/sia.740200813
Werner, W. S. M., Smith, G. C., Livesey, A. K. (1994) Maximum entropy analysis of the effects of elastic scattering on the reconstruction of depth profiles from angle-dependent XPS measurements. Surface and Interface Analysis, 21 (1). 38-43 doi:10.1002/sia.740210106
Macak, Karol (2011) Encoding of stoichiometric constraints in the composition depth profile reconstruction from angle resolved X-ray photoelectron spectroscopy data. Surface and Interface Analysis, 43 (13). 1581-1604 doi:10.1002/sia.3753
Dwyer, V. M., Richards, J. M. (1992) The depth distribution function in Auger/XPS analysis. Surface and Interface Analysis, 18 (7). 555-560 doi:10.1002/sia.740180717
Seelmann-Eggebert, M., Keller, Robert C. (1995) Information on compositional depth profiles conveyed by angle-resolved XPS. Surface and Interface Analysis, 23 (9). 589-600 doi:10.1002/sia.740230904
Tielsch, Brian J., Fulghum, Julia E. (1994) Application of angle-resolved XPS algorithms to overlayers and concentration gradients. Surface and Interface Analysis, 21 (9). 621-630 doi:10.1002/sia.740210905
Werner, Wolfgang S. M., Tilinin, Igor S., Beilschmidt, Herbert, Hayek, Markus (1994) Simultaneous background subtraction and depth profile determination from AES/XPS measurements. Surface and Interface Analysis, 21 (8). 537-545 doi:10.1002/sia.740210805
Werner, W. S. M., Störi, H. (1992) A new formalism for angle-resolved X-ray photoelectron spectroscopy (ARXPS) and Auger electron spectroscopy (ARAES) of non-crystalline solids taking elastic electron scattering into account. Surface and Interface Analysis, 19 (1). 83-88 doi:10.1002/sia.740190119
Zommer, L., Lisowski, W., Jablonski, A. (2014) Contribution of elastic photoelectron scattering to the shape of the measured XPS intensity in-depth profile. Surface and Interface Analysis, 46 (4). 269-275 doi:10.1002/sia.5409
Powell, C. J., Werner, W. S. M., Smekal, W. (2011) Effects of elastic scattering and analyzer-acceptance angle on the analysis of angle-resolved X-ray photoelectron spectroscopy data. Surface and Interface Analysis, 43 (7). 1046-1056 doi:10.1002/sia.3689
Jisl, Rudolf (1990) Restoration of the depth-concentration profile from the angle-resolved relative intensities of x-ray photoelectron spectra. Surface and Interface Analysis, 15 (12). 719-726 doi:10.1002/sia.740151203
 
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