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Hirose, Akio, Fujii, Toshio, Imamura, Takeshi, Kobayashi, Kojiro F. (2001) Influence of Interfacial Reaction on Reliability of QFP Joints with Sn-Ag Based Pb Free Solders. MATERIALS TRANSACTIONS, 42 (5). 794-802 doi:10.2320/matertrans.42.794

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Reference TypeJournal (article/letter/editorial)
TitleInfluence of Interfacial Reaction on Reliability of QFP Joints with Sn-Ag Based Pb Free Solders
JournalMATERIALS TRANSACTIONS
AuthorsHirose, AkioAuthor
Fujii, ToshioAuthor
Imamura, TakeshiAuthor
Kobayashi, Kojiro F.Author
Year2001Volume42
Issue5
PublisherJapan Institute of Metals
DOIdoi:10.2320/matertrans.42.794Search in ResearchGate
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Mindat Ref. ID7775898Long-form Identifiermindat:1:5:7775898:1
GUID0
Full ReferenceHirose, Akio, Fujii, Toshio, Imamura, Takeshi, Kobayashi, Kojiro F. (2001) Influence of Interfacial Reaction on Reliability of QFP Joints with Sn-Ag Based Pb Free Solders. MATERIALS TRANSACTIONS, 42 (5). 794-802 doi:10.2320/matertrans.42.794
Plain TextHirose, Akio, Fujii, Toshio, Imamura, Takeshi, Kobayashi, Kojiro F. (2001) Influence of Interfacial Reaction on Reliability of QFP Joints with Sn-Ag Based Pb Free Solders. MATERIALS TRANSACTIONS, 42 (5). 794-802 doi:10.2320/matertrans.42.794
In(2001) MATERIALS TRANSACTIONS Vol. 42 (5) Japan Institute of Metals


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