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de Kock, A.J.R., Beeftink, F.M., Schell, K.J. (1972) Investigation of Lithium Precipitation in Germanium Crystals by X‐Ray Transmission Topography. Applied Physics Letters, 20 (2). 81-83 doi:10.1063/1.1654056

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Reference TypeJournal (article/letter/editorial)
TitleInvestigation of Lithium Precipitation in Germanium Crystals by X‐Ray Transmission Topography
JournalApplied Physics Letters
Authorsde Kock, A.J.R.Author
Beeftink, F.M.Author
Schell, K.J.Author
Year1972 (January 15)Volume20
Issue2
PublisherAIP Publishing
DOIdoi:10.1063/1.1654056Search in ResearchGate
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Mindat Ref. ID8456174Long-form Identifiermindat:1:5:8456174:5
GUID0
Full Referencede Kock, A.J.R., Beeftink, F.M., Schell, K.J. (1972) Investigation of Lithium Precipitation in Germanium Crystals by X‐Ray Transmission Topography. Applied Physics Letters, 20 (2). 81-83 doi:10.1063/1.1654056
Plain Textde Kock, A.J.R., Beeftink, F.M., Schell, K.J. (1972) Investigation of Lithium Precipitation in Germanium Crystals by X‐Ray Transmission Topography. Applied Physics Letters, 20 (2). 81-83 doi:10.1063/1.1654056
In(1972, January) Applied Physics Letters Vol. 20 (2) AIP Publishing

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Meieran, E. S., Blech, I.A. (1972) High‐Intensity Transmission X‐Ray Topography of Homogeneously Bent Crystals. Journal of Applied Physics, 43 (2). 265-269 doi:10.1063/1.1661104
Meieran, E.S., Blech, I.A. (1972) Erratum: High‐Intensity Transmission X‐Ray Topography of Homogeneously Bent Crystals. Journal of Applied Physics, 43 (7). 3231 doi:10.1063/1.1661698
Thomas, J. E., Stuber, A. B., Dearlove, J. W. (1972) X‐Ray Study of Lithium Precipitation in Germanium. Journal of Applied Physics, 43 (1). 251-253 doi:10.1063/1.1660826
Wenzl, Helmut F. (1971) Investigation of Lithium Precipitates in Germanium Crystals by Anomalous X-Ray Transmission. Zeitschrift für Naturforschung A, 26 (3). 495-501 doi:10.1515/zna-1971-0318
Patel, J. R. (1973) X‐ray anomalous transmission and topography of oxygen precipitation in silicon. Journal of Applied Physics, 44 (9). 3903-3906 doi:10.1063/1.1662869
de Kock, A. J. R., Boonen, P. G. T. (1973) The investigation of microdefects in high‐purity silicon crystals by means of lithium decoration. Journal of Applied Physics, 44 (6). 2816-2828 doi:10.1063/1.1662656
Patel, Jamstred R. (1972) X-Ray anomalous transmission and topography of impurity clustering in perfect crystals. Bulletin de Minéralogie, 95 (6) 700-712 doi:10.3406/bulmi.1972.6758
Theunissen, M.J.J., Goemans, A.H., De Kock, A.J.R., Geijselaers, M.L.J. (1989) Analysis of structural defects in silicon-on-insulator layers with x-ray reflection topography. Journal of Crystal Growth, 97 (3). 599-606 doi:10.1016/0022-0248(89)90560-5
Segmüller, Armin, Light, T. B. (1969) Comment on ``X‐Ray Stress Topography of Thin Films on Germanium''. Journal of Applied Physics, 40 (4). 1972 doi:10.1063/1.1657877
Wagatsuma, Ryugo, Sumino, Koji, Uchida, Wakio, Yamamoto, Soichi (1971) Distribution Patterns of Strain and Dislocations Around Indented Areas in Germanium Crystals as Observed by X‐Ray Topography. Journal of Applied Physics, 42 (1). 222-229 doi:10.1063/1.1659572
Schwuttke, G. H., Howard, J. K. (1969) Reply to Comment on ``X‐Ray Stress Topography of Thin Films on Germanium''. Journal of Applied Physics, 40 (4). 1972 doi:10.1063/1.1657878
 
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