Reference Type | Journal (article/letter/editorial) |
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Title | Imaging of deep level domains in semi‐insulating GaAs by voltage contrast |
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Journal | Applied Physics Letters |
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Authors | Johnson, D. A. | Author |
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Myhajlenko, S. | Author |
Edwards, J. L. | Author |
Maracas, G. N. | Author |
Roedel, R. J. | Author |
Goronkin, H. | Author |
Year | 1987 (October 12) | Volume | 51 |
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Issue | 15 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.98768Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8481143 | Long-form Identifier | mindat:1:5:8481143:7 |
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GUID | 0 |
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Full Reference | Johnson, D. A., Myhajlenko, S., Edwards, J. L., Maracas, G. N., Roedel, R. J., Goronkin, H. (1987) Imaging of deep level domains in semi‐insulating GaAs by voltage contrast. Applied Physics Letters, 51 (15). 1152-1154 doi:10.1063/1.98768 |
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Plain Text | Johnson, D. A., Myhajlenko, S., Edwards, J. L., Maracas, G. N., Roedel, R. J., Goronkin, H. (1987) Imaging of deep level domains in semi‐insulating GaAs by voltage contrast. Applied Physics Letters, 51 (15). 1152-1154 doi:10.1063/1.98768 |
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In | (1987, October) Applied Physics Letters Vol. 51 (15) AIP Publishing |
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