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Ishida, Makoto, Katakabe, Ichiro, Nakamura, Tetsuro, Ohtake, Norio (1988) Epitaxial Al2O3films on Si by low‐pressure chemical vapor deposition. Applied Physics Letters, 52 (16). 1326-1328 doi:10.1063/1.99685

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Reference TypeJournal (article/letter/editorial)
TitleEpitaxial Al2O3films on Si by low‐pressure chemical vapor deposition
JournalApplied Physics Letters
AuthorsIshida, MakotoAuthor
Katakabe, IchiroAuthor
Nakamura, TetsuroAuthor
Ohtake, NorioAuthor
Year1988 (April 18)Volume52
Issue16
PublisherAIP Publishing
DOIdoi:10.1063/1.99685Search in ResearchGate
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Mindat Ref. ID8482823Long-form Identifiermindat:1:5:8482823:3
GUID0
Full ReferenceIshida, Makoto, Katakabe, Ichiro, Nakamura, Tetsuro, Ohtake, Norio (1988) Epitaxial Al2O3films on Si by low‐pressure chemical vapor deposition. Applied Physics Letters, 52 (16). 1326-1328 doi:10.1063/1.99685
Plain TextIshida, Makoto, Katakabe, Ichiro, Nakamura, Tetsuro, Ohtake, Norio (1988) Epitaxial Al2O3films on Si by low‐pressure chemical vapor deposition. Applied Physics Letters, 52 (16). 1326-1328 doi:10.1063/1.99685
In(1988, April) Applied Physics Letters Vol. 52 (16) AIP Publishing


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