Reference Type | Journal (article/letter/editorial) |
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Title | Electron and x‐ray diffraction study of ZnTe‐ZnS strained‐layer superlattices grown by molecular beam epitaxy |
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Journal | Applied Physics Letters |
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Authors | Karasawa, Takeshi | Author |
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Ohkawa, Kazuhiro | Author |
Mitsuyu, Tsuneo | Author |
Year | 1989 (January 9) | Volume | 54 |
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Issue | 2 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.101224Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8486626 | Long-form Identifier | mindat:1:5:8486626:0 |
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GUID | 0 |
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Full Reference | Karasawa, Takeshi, Ohkawa, Kazuhiro, Mitsuyu, Tsuneo (1989) Electron and x‐ray diffraction study of ZnTe‐ZnS strained‐layer superlattices grown by molecular beam epitaxy. Applied Physics Letters, 54 (2). 117-119 doi:10.1063/1.101224 |
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Plain Text | Karasawa, Takeshi, Ohkawa, Kazuhiro, Mitsuyu, Tsuneo (1989) Electron and x‐ray diffraction study of ZnTe‐ZnS strained‐layer superlattices grown by molecular beam epitaxy. Applied Physics Letters, 54 (2). 117-119 doi:10.1063/1.101224 |
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In | (1989, January) Applied Physics Letters Vol. 54 (2) AIP Publishing |
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