Reference Type | Journal (article/letter/editorial) |
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Title | Direct observation of Si delta‐doped GaAs by transmission electron microscopy |
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Journal | Applied Physics Letters |
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Authors | Liu, D. G. | Author |
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Fan, J. C. | Author |
Lee, C. P. | Author |
Tsai, C. M. | Author |
Chang, K. H. | Author |
Liou, D. C. | Author |
Lee, T. L. | Author |
Chen, L. J. | Author |
Year | 1992 (May 25) | Volume | 60 |
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Issue | 21 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.106902Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8498840 | Long-form Identifier | mindat:1:5:8498840:1 |
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GUID | 0 |
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Full Reference | Liu, D. G., Fan, J. C., Lee, C. P., Tsai, C. M., Chang, K. H., Liou, D. C., Lee, T. L., Chen, L. J. (1992) Direct observation of Si delta‐doped GaAs by transmission electron microscopy. Applied Physics Letters, 60 (21). 2628-2630 doi:10.1063/1.106902 |
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Plain Text | Liu, D. G., Fan, J. C., Lee, C. P., Tsai, C. M., Chang, K. H., Liou, D. C., Lee, T. L., Chen, L. J. (1992) Direct observation of Si delta‐doped GaAs by transmission electron microscopy. Applied Physics Letters, 60 (21). 2628-2630 doi:10.1063/1.106902 |
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In | (1992, May) Applied Physics Letters Vol. 60 (21) AIP Publishing |
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