Reference Type | Journal (article/letter/editorial) |
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Title | Annealing effect on concentration of EL6-like deep-level state in low-temperature-grown molecular beam epitaxial GaAs |
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Journal | Applied Physics Letters |
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Authors | Darmo, J. | Author |
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Dubecký, F. | Author |
Kordoš, P. | Author |
Förster, A. | Author |
Year | 1998 (February 2) | Volume | 72 |
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Issue | 5 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.120815Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8521519 | Long-form Identifier | mindat:1:5:8521519:9 |
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GUID | 0 |
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Full Reference | Darmo, J., Dubecký, F., Kordoš, P., Förster, A. (1998) Annealing effect on concentration of EL6-like deep-level state in low-temperature-grown molecular beam epitaxial GaAs. Applied Physics Letters, 72 (5). 590-592 doi:10.1063/1.120815 |
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Plain Text | Darmo, J., Dubecký, F., Kordoš, P., Förster, A. (1998) Annealing effect on concentration of EL6-like deep-level state in low-temperature-grown molecular beam epitaxial GaAs. Applied Physics Letters, 72 (5). 590-592 doi:10.1063/1.120815 |
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In | (1998, February) Applied Physics Letters Vol. 72 (5) AIP Publishing |
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