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Gungor, M. Rauf, Maroudas, Dimitrios, Zhou, Shujia (2000) Molecular-dynamics study of the mechanism and kinetics of void growth in ductile metallic thin films. Applied Physics Letters, 77 (3). 343-345 doi:10.1063/1.126971

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Reference TypeJournal (article/letter/editorial)
TitleMolecular-dynamics study of the mechanism and kinetics of void growth in ductile metallic thin films
JournalApplied Physics Letters
AuthorsGungor, M. RaufAuthor
Maroudas, DimitriosAuthor
Zhou, ShujiaAuthor
Year2000 (July 17)Volume77
Issue3
PublisherAIP Publishing
DOIdoi:10.1063/1.126971Search in ResearchGate
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Mindat Ref. ID8528060Long-form Identifiermindat:1:5:8528060:7
GUID0
Full ReferenceGungor, M. Rauf, Maroudas, Dimitrios, Zhou, Shujia (2000) Molecular-dynamics study of the mechanism and kinetics of void growth in ductile metallic thin films. Applied Physics Letters, 77 (3). 343-345 doi:10.1063/1.126971
Plain TextGungor, M. Rauf, Maroudas, Dimitrios, Zhou, Shujia (2000) Molecular-dynamics study of the mechanism and kinetics of void growth in ductile metallic thin films. Applied Physics Letters, 77 (3). 343-345 doi:10.1063/1.126971
In(2000, July) Applied Physics Letters Vol. 77 (3) AIP Publishing

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Gungor, M. Rauf, Maroudas, Dimitrios (2005) Relaxation of biaxial tensile strain in ultrathin metallic films: Ductile void growth versus nanocrystalline domain formation. Applied Physics Letters, 87 (17). 171913pp. doi:10.1063/1.2108128
Gungor, M. Rauf, Maroudas, Dimitrios (1998) Electromigration-induced failure of metallic thin films due to transgranular void propagation. Applied Physics Letters, 72 (26). 3452-3454 doi:10.1063/1.121663
Gungor, M. Rauf, Maroudas, Dimitrios, Gray, Leonard J. (1998) Effects of mechanical stress on electromigration-driven transgranular void dynamics in passivated metallic thin films. Applied Physics Letters, 73 (26). 3848-3850 doi:10.1063/1.122913
Gungor, M. Rauf, Maroudas, Dimitrios (2007) Stress-induced deceleration of electromigration-driven void motion in metallic thin films. Journal of Applied Physics, 101 (6). 63513pp. doi:10.1063/1.2709616
Sfyris, Georgios I., Rauf Gungor, M., Maroudas, Dimitrios (2011) Effect of applied stress tensor anisotropy on the electromechanically driven complex dynamics of void surfaces in metallic thin films. Journal of Applied Physics, 110 (6). 63705pp. doi:10.1063/1.3638070
Gungor, M. Rauf, Maroudas, Dimitrios (2005) Atomistic mechanisms of strain relaxation due to ductile void growth in ultrathin films of face-centered-cubic metals. Journal of Applied Physics, 97 (11). 113527pp. doi:10.1063/1.1926393
Gungor, M. Rauf, Maroudas, Dimitrios (1999) Theoretical analysis of electromigration-induced failure of metallic thin films due to transgranular void propagation. Journal of Applied Physics, 85 (4). 2233-2246 doi:10.1063/1.369532
Cho, Jaeseol, Gungor, M. Rauf, Maroudas, Dimitrios (2004) Electromigration-driven motion of morphologically stable voids in metallic thin films: Universal scaling of migration speed with void size. Applied Physics Letters, 85 (12). 2214-2216 doi:10.1063/1.1790037
Cho, Jaeseol, Gungor, M. Rauf, Maroudas, Dimitrios (2005) Effects of electromigration-induced void dynamics on the evolution of electrical resistance in metallic interconnect lines. Applied Physics Letters, 86 (24). 241905pp. doi:10.1063/1.1947373
Tomar, Vivek, Gungor, M. Rauf, Maroudas, Dimitrios (2008) Theoretical analysis of texture effects on the surface morphological stability of metallic thin films. Applied Physics Letters, 92 (18). 181905pp. doi:10.1063/1.2912037
Kolluri, Kedarnath, Gungor, M. Rauf, Maroudas, Dimitrios (2007) Void nucleation in biaxially strained ultrathin films of face-centered cubic metals. Applied Physics Letters, 90 (22). 221907pp. doi:10.1063/1.2744477
 
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