Richter, S., Geva, M., Garno, J. P., Kleiman, R. N. (2000) Metal–insulator–semiconductor tunneling microscope: two-dimensional dopant profiling of semiconductors with conducting atomic-force microscopy. Applied Physics Letters, 77 (3). 456-458 doi:10.1063/1.127008
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Metal–insulator–semiconductor tunneling microscope: two-dimensional dopant profiling of semiconductors with conducting atomic-force microscopy | ||
| Journal | Applied Physics Letters | ||
| Authors | Richter, S. | Author | |
| Geva, M. | Author | ||
| Garno, J. P. | Author | ||
| Kleiman, R. N. | Author | ||
| Year | 2000 (July 17) | Volume | 77 |
| Issue | 3 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.127008Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8528097 | Long-form Identifier | mindat:1:5:8528097:1 |
| GUID | 0 | ||
| Full Reference | Richter, S., Geva, M., Garno, J. P., Kleiman, R. N. (2000) Metal–insulator–semiconductor tunneling microscope: two-dimensional dopant profiling of semiconductors with conducting atomic-force microscopy. Applied Physics Letters, 77 (3). 456-458 doi:10.1063/1.127008 | ||
| Plain Text | Richter, S., Geva, M., Garno, J. P., Kleiman, R. N. (2000) Metal–insulator–semiconductor tunneling microscope: two-dimensional dopant profiling of semiconductors with conducting atomic-force microscopy. Applied Physics Letters, 77 (3). 456-458 doi:10.1063/1.127008 | ||
| In | (2000, July) Applied Physics Letters Vol. 77 (3) AIP Publishing | ||
See Also
These are possibly similar items as determined by title/reference text matching only.
