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Cheng, Y. T., Huang, Y. S., Lin, D. Y., Tiong, K. K., Pollak, Fred H., Evans, K. R. (2001) Surface photovoltage spectroscopy characterization of a GaAlAs/InGaAs/GaAs pseudomorphic high electron mobility transistor structure. Applied Physics Letters, 79 (7). 949-951 doi:10.1063/1.1392974

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Reference TypeJournal (article/letter/editorial)
TitleSurface photovoltage spectroscopy characterization of a GaAlAs/InGaAs/GaAs pseudomorphic high electron mobility transistor structure
JournalApplied Physics Letters
AuthorsCheng, Y. T.Author
Huang, Y. S.Author
Lin, D. Y.Author
Tiong, K. K.Author
Pollak, Fred H.Author
Evans, K. R.Author
Year2001 (August 13)Volume79
Issue7
PublisherAIP Publishing
DOIdoi:10.1063/1.1392974Search in ResearchGate
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Mindat Ref. ID8531131Long-form Identifiermindat:1:5:8531131:4
GUID0
Full ReferenceCheng, Y. T., Huang, Y. S., Lin, D. Y., Tiong, K. K., Pollak, Fred H., Evans, K. R. (2001) Surface photovoltage spectroscopy characterization of a GaAlAs/InGaAs/GaAs pseudomorphic high electron mobility transistor structure. Applied Physics Letters, 79 (7). 949-951 doi:10.1063/1.1392974
Plain TextCheng, Y. T., Huang, Y. S., Lin, D. Y., Tiong, K. K., Pollak, Fred H., Evans, K. R. (2001) Surface photovoltage spectroscopy characterization of a GaAlAs/InGaAs/GaAs pseudomorphic high electron mobility transistor structure. Applied Physics Letters, 79 (7). 949-951 doi:10.1063/1.1392974
In(2001, August) Applied Physics Letters Vol. 79 (7) AIP Publishing

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Lin, D. Y., Huang, Y. S., Shou, T. S., Tiong, K. K., Pollak, Fred H. (2001) Temperature-dependent contactless electroreflectance and photoluminescence study of GaAlAs/InGaAs/GaAs pseudomorphic high electron mobility transistor structures. Journal of Applied Physics, 90 (12). 6421-6427 doi:10.1063/1.1416854
Lin, D. Y., Liang, S. H., Huang, Y. S., Tiong, K. K., Pollak, Fred H., Evans, K. R. (1999) Room-temperature photoreflectance and photoluminescence characterization of the AlGaAs/InGaAs/GaAs pseudomorphic high electron mobility transistor structures with varied quantum well compositional profiles. Journal of Applied Physics, 85 (12). 8235-8241 doi:10.1063/1.370664
Wang, S. D., Liang, J. S., Huang, Y. S., Tien, C. W., Chang, Y. M., Chen, C. W., Li, N. Y., Tiong, K. K., Pollak, Fred H. (2002) Angle-dependent differential-photovoltage spectroscopy for the characterization of a GaAs/GaAlAs based vertical-cavity surface-emitting laser structure. Journal of Applied Physics, 92 (5). 2350-2353 doi:10.1063/1.1497697
Chen, T. H., Huang, Y. S., Lin, D. Y., Pollak, Fred H., Goorsky, M. S., Streit, D. C., Wojtowicz, M. (2000) Room temperature polarized photoreflectance characterization of GaAlAs/InGaAs/GaAs high electron mobility transistor structures including the influence of strain relaxation. Journal of Applied Physics, 88 (2). 883-888 doi:10.1063/1.373751
Liang, J. S., Huang, Y. S., Tien, C. W., Chang, Y. M., Chen, C. W., Li, N. Y., Li, P. W., Pollak, Fred H. (2001) Surface photovoltage spectroscopy characterization of a GaAs/GaAlAs vertical-cavity-surface-emitting-laser structure: Angle dependence. Applied Physics Letters, 79 (20). 3227-3229 doi:10.1063/1.1418027
Liang, J. S., Wang, S. D., Huang, Y. S., Tien, C. W., Chang, Y. M., Chen, C. W., Li, N. Y., Lin, D. Y., Pollak, Fred H. (2002) Polarized edge-incident photovoltage spectroscopy and reflectance characterization of a GaAs/GaAlAs vertical-cavity surface-emitting laser structure. Applied Physics Letters, 80 (5). 752-754 doi:10.1063/1.1445463
Huang, Y. S., Malikova, L., Pollak, Fred H., Shen, H., Pamulapati, J., Newman, P. (2000) Surface photovoltage spectroscopy, photoreflectance, and reflectivity characterization of an InGaAs/GaAs/GaAlAs vertical-cavity surface-emitting laser including temperature dependence. Applied Physics Letters, 77 (1). 37-39 doi:10.1063/1.126869
Chan, C. H., Wu, J. D., Huang, Y. S., Su, Y. K., Tiong, K. K. (2009) Temperature dependent surface photovoltage spectroscopy characterization of highly strained InGaAs/GaAs double quantum well structures grown by metal organic vapor phase epitaxy. Journal of Applied Physics, 106 (4). 43523pp. doi:10.1063/1.3208053
Liang, J S, Wang, S D, Huang, Y S, Tien, C W, Chang, Y M, Chen, C W, Li, N Y, Tiong, K K, Pollak, F H (2003) Surface photovoltage spectroscopy as a valuable nondestructive characterization technique for GaAs/GaAlAs vertical-cavity surface-emitting laser structures. Journal of Physics: Condensed Matter, 15 (2). 55-66 doi:10.1088/0953-8984/15/2/306
Lin, D. Y., Chou, Y. H., Huang, Y. S., Tiong, K. K. (2005) Coupling between the exciton and cavity modes in a GaAs∕GaAlAs asymmetric microcavity structure. Journal of Applied Physics, 97 (9). 93511pp. doi:10.1063/1.1883303
Huang, Y. S., Sun, W. D., Malikova, L., Pollak, Fred H., Ferguson, I., Hou, H., Feng, Z. C., Ryan, T., Fantner, E. B. (1999) Room-temperature photoluminescence, contactless electroreflectance, and x-ray characterization of a double-side delta-doped GaAlAs/InGaAs high electron mobility transistor structure. Applied Physics Letters, 74 (13). 1851-1853 doi:10.1063/1.123690
 
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