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Liang, J S, Wang, S D, Huang, Y S, Tien, C W, Chang, Y M, Chen, C W, Li, N Y, Tiong, K K, Pollak, F H (2003) Surface photovoltage spectroscopy as a valuable nondestructive characterization technique for GaAs/GaAlAs vertical-cavity surface-emitting laser structures. Journal of Physics: Condensed Matter, 15 (2). 55-66 doi:10.1088/0953-8984/15/2/306

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Reference TypeJournal (article/letter/editorial)
TitleSurface photovoltage spectroscopy as a valuable nondestructive characterization technique for GaAs/GaAlAs vertical-cavity surface-emitting laser structures
JournalJournal of Physics: Condensed Matter
AuthorsLiang, J SAuthor
Wang, S DAuthor
Huang, Y SAuthor
Tien, C WAuthor
Chang, Y MAuthor
Chen, C WAuthor
Li, N YAuthor
Tiong, K KAuthor
Pollak, F HAuthor
Year2003 (January 22)Volume15
Issue2
PublisherIOP Publishing
DOIdoi:10.1088/0953-8984/15/2/306Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8694209Long-form Identifiermindat:1:5:8694209:6
GUID0
Full ReferenceLiang, J S, Wang, S D, Huang, Y S, Tien, C W, Chang, Y M, Chen, C W, Li, N Y, Tiong, K K, Pollak, F H (2003) Surface photovoltage spectroscopy as a valuable nondestructive characterization technique for GaAs/GaAlAs vertical-cavity surface-emitting laser structures. Journal of Physics: Condensed Matter, 15 (2). 55-66 doi:10.1088/0953-8984/15/2/306
Plain TextLiang, J S, Wang, S D, Huang, Y S, Tien, C W, Chang, Y M, Chen, C W, Li, N Y, Tiong, K K, Pollak, F H (2003) Surface photovoltage spectroscopy as a valuable nondestructive characterization technique for GaAs/GaAlAs vertical-cavity surface-emitting laser structures. Journal of Physics: Condensed Matter, 15 (2). 55-66 doi:10.1088/0953-8984/15/2/306
In(2003, January) Journal of Physics: Condensed Matter Vol. 15 (2) IOP Publishing

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