Vote for your favorite mineral in #MinCup25! - Stibnite vs. Perovskite
It's all about how minerals interact with humans as dramatic #stibnite faces off against futuristic #perovskite.
Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Ushio, Jiro, Maruizumi, Takuya, Kushida-Abdelghafar, Keiko (2002) Interface structures generated by negative-bias temperature instability in Si/SiO2 and Si/SiOxNy interfaces. Applied Physics Letters, 81 (10). 1818-1820 doi:10.1063/1.1504872

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleInterface structures generated by negative-bias temperature instability in Si/SiO2 and Si/SiOxNy interfaces
JournalApplied Physics Letters
AuthorsUshio, JiroAuthor
Maruizumi, TakuyaAuthor
Kushida-Abdelghafar, KeikoAuthor
Year2002 (September 2)Volume81
Issue10
PublisherAIP Publishing
DOIdoi:10.1063/1.1504872Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8532936Long-form Identifiermindat:1:5:8532936:8
GUID0
Full ReferenceUshio, Jiro, Maruizumi, Takuya, Kushida-Abdelghafar, Keiko (2002) Interface structures generated by negative-bias temperature instability in Si/SiO2 and Si/SiOxNy interfaces. Applied Physics Letters, 81 (10). 1818-1820 doi:10.1063/1.1504872
Plain TextUshio, Jiro, Maruizumi, Takuya, Kushida-Abdelghafar, Keiko (2002) Interface structures generated by negative-bias temperature instability in Si/SiO2 and Si/SiOxNy interfaces. Applied Physics Letters, 81 (10). 1818-1820 doi:10.1063/1.1504872
In(2002, September) Applied Physics Letters Vol. 81 (10) AIP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Kushida-Abdelghafar, Keiko, Watanabe, Kikuo, Ushio, Jiro, Murakami, Eiichi (2002) Effect of nitrogen at SiO2/Si interface on reliability issues—negative-bias-temperature instability and Fowler–Nordheim-stress degradation. Applied Physics Letters, 81 (23). 4362-4364 doi:10.1063/1.1526158
Ushio, Jiro, Watanabe, Kikuo, Kushida-Abdelghafar, Keiko, Maruizumi, Takuya (2003) The role of hydrogen migration in negative-bias temperature instability. Applied Surface Science, 216. 258-263 doi:10.1016/s0169-4332(03)00378-7
Kushida-Abdelghafar, Keiko, Watanabe, Kikuo, Kikawa, Takeshi, Kamigaki, Yoshiaki, Ushio, Jiro (2002) An atomic model of the nitrous-oxide-nitrided SiO2/Si interface. Journal of Applied Physics, 92 (5). 2475-2478 doi:10.1063/1.1497720
Ushio, Jiro, Okuyama, Yutaka, Maruizumi, Takuya (2005) Electric-field dependence of negative-bias temperature instability. Journal of Applied Physics, 97 (8). 86101pp. doi:10.1063/1.1866493
Ushio, Jiro, Maruizumi, Takuya, Miyao, Masanobu (1999) Incorporation of N into Si/SiO2 interfaces: Molecular orbital calculations to evaluate interface strain and heat of reaction. Applied Physics Letters, 75 (5). 680-682 doi:10.1063/1.124480
Higuchi, Masaaki, Sugawa, Shigetoshi, Ikenaga, Eiji, Ushio, Jiro, Nohira, Hiroshi, Maruizumi, Takuya, Teramoto, Akinobu, Ohmi, Tadahiro, Hattori, Takeo (2007) Subnitride and valence band offset at Si3N4∕Si interface formed using nitrogen-hydrogen radicals. Applied Physics Letters, 90 (12). 123114pp. doi:10.1063/1.2715037
Zekeriya, Viktor, Ma, T. P. (1983) Interface traps generated by internal photoemission in Al‐SiO2‐Si structures. Applied Physics Letters, 43 (1). 95-97 doi:10.1063/1.94135
Ogawa, Shigeo, Shimaya, Masakazu, Shiono, Noboru (1995) Interface‐trap generation at ultrathin SiO2(4–6 nm)‐Si interfaces during negative‐bias temperature aging. Journal of Applied Physics, 77 (3). 1137-1148 doi:10.1063/1.358977
Tan, Shyue Seng, Chen, Tu Pei, Ang, Chew Hoe, Tan, Yun Ling, Chan, Lap (2002) Influence of Nitrogen Proximity from the Si/SiO2 Interface on Negative Bias Temperature Instability. Japanese Journal of Applied Physics, 41. doi:10.1143/jjap.41.l1031
Ushio, Jiro, Nakagawa, Kiyokazu, Miyao, Masanobu, Maruizumi, Takuya (1998) Surface Segregation Behaviors of B, Ga, and Sb during Si Molecular Beam Epitaxy: Calculation Using a First-Principles Method. Japanese Journal of Applied Physics, 37. 1320-1324 doi:10.1143/jjap.37.1320
Fujieda, Shinji, Miura, Yoshinao, Saitoh, Motofumi, Hasegawa, Eiji, Koyama, Shin, Ando, Koichi (2003) Interface defects responsible for negative-bias temperature instability in plasma-nitrided SiON/Si(100) systems. Applied Physics Letters, 82 (21). 3677-3679 doi:10.1063/1.1578535
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are Š OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: September 18, 2025 04:24:05
Go to top of page