Gao, Cun-Fa, Noda, Naotake (2005) Effects of partial discharges on crack growth in dielectrics. Applied Physics Letters, 86 (16). 162904pp. doi:10.1063/1.1906298
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Effects of partial discharges on crack growth in dielectrics | ||
Journal | Applied Physics Letters | ||
Authors | Gao, Cun-Fa | Author | |
Noda, Naotake | Author | ||
Year | 2005 (April 18) | Volume | 86 |
Issue | 16 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.1906298Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8542511 | Long-form Identifier | mindat:1:5:8542511:2 |
GUID | 0 | ||
Full Reference | Gao, Cun-Fa, Noda, Naotake (2005) Effects of partial discharges on crack growth in dielectrics. Applied Physics Letters, 86 (16). 162904pp. doi:10.1063/1.1906298 | ||
Plain Text | Gao, Cun-Fa, Noda, Naotake (2005) Effects of partial discharges on crack growth in dielectrics. Applied Physics Letters, 86 (16). 162904pp. doi:10.1063/1.1906298 | ||
In | (2005, April) Applied Physics Letters Vol. 86 (16) AIP Publishing |
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