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Mani, Sathya, Saif, Taher M. (2005) Mechanism of controlled crack formation in thin-film dielectrics. Applied Physics Letters, 86 (20). 201903pp. doi:10.1063/1.1927267

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Reference TypeJournal (article/letter/editorial)
TitleMechanism of controlled crack formation in thin-film dielectrics
JournalApplied Physics Letters
AuthorsMani, SathyaAuthor
Saif, Taher M.Author
Year2005 (May 16)Volume86
Issue20
PublisherAIP Publishing
DOIdoi:10.1063/1.1927267Search in ResearchGate
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Mindat Ref. ID8542912Long-form Identifiermindat:1:5:8542912:7
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Full ReferenceMani, Sathya, Saif, Taher M. (2005) Mechanism of controlled crack formation in thin-film dielectrics. Applied Physics Letters, 86 (20). 201903pp. doi:10.1063/1.1927267
Plain TextMani, Sathya, Saif, Taher M. (2005) Mechanism of controlled crack formation in thin-film dielectrics. Applied Physics Letters, 86 (20). 201903pp. doi:10.1063/1.1927267
In(2005, May) Applied Physics Letters Vol. 86 (20) AIP Publishing

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