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Lulevich, Valentin, Ducker, William A. (2005) Scanning near-field optical microscopy utilizing silicon nitride probe photoluminescence. Applied Physics Letters, 87 (21). 214107pp. doi:10.1063/1.2136216

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Reference TypeJournal (article/letter/editorial)
TitleScanning near-field optical microscopy utilizing silicon nitride probe photoluminescence
JournalApplied Physics Letters
AuthorsLulevich, ValentinAuthor
Ducker, William A.Author
Year2005 (November 21)Volume87
Issue21
PublisherAIP Publishing
DOIdoi:10.1063/1.2136216Search in ResearchGate
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Mindat Ref. ID8545192Long-form Identifiermindat:1:5:8545192:2
GUID0
Full ReferenceLulevich, Valentin, Ducker, William A. (2005) Scanning near-field optical microscopy utilizing silicon nitride probe photoluminescence. Applied Physics Letters, 87 (21). 214107pp. doi:10.1063/1.2136216
Plain TextLulevich, Valentin, Ducker, William A. (2005) Scanning near-field optical microscopy utilizing silicon nitride probe photoluminescence. Applied Physics Letters, 87 (21). 214107pp. doi:10.1063/1.2136216
In(2005, November) Applied Physics Letters Vol. 87 (21) AIP Publishing

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