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Yuan, Guangwei, Lear, Kevin L., Stephens, Matthew D., Dandy, David S. (2005) Characterization of a 90° waveguide bend using near-field scanning optical microscopy. Applied Physics Letters, 87 (19). 191107pp. doi:10.1063/1.2126135

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Reference TypeJournal (article/letter/editorial)
TitleCharacterization of a 90° waveguide bend using near-field scanning optical microscopy
JournalApplied Physics Letters
AuthorsYuan, GuangweiAuthor
Lear, Kevin L.Author
Stephens, Matthew D.Author
Dandy, David S.Author
Year2005 (November 7)Volume87
Issue19
PublisherAIP Publishing
DOIdoi:10.1063/1.2126135Search in ResearchGate
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Mindat Ref. ID8544892Long-form Identifiermindat:1:5:8544892:8
GUID0
Full ReferenceYuan, Guangwei, Lear, Kevin L., Stephens, Matthew D., Dandy, David S. (2005) Characterization of a 90° waveguide bend using near-field scanning optical microscopy. Applied Physics Letters, 87 (19). 191107pp. doi:10.1063/1.2126135
Plain TextYuan, Guangwei, Lear, Kevin L., Stephens, Matthew D., Dandy, David S. (2005) Characterization of a 90° waveguide bend using near-field scanning optical microscopy. Applied Physics Letters, 87 (19). 191107pp. doi:10.1063/1.2126135
In(2005, November) Applied Physics Letters Vol. 87 (19) AIP Publishing

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