Huntington, S. T., Nugent, K. A., Roberts, A., Mulvaney, P., Lo, K. M. (1997) Field characterization of a D-shaped optical fiber using scanning near-field optical microscopy. Journal of Applied Physics, 82 (2). 510-513 doi:10.1063/1.365608

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Reference Type	Journal (article/letter/editorial)
Title	Field characterization of a D-shaped optical fiber using scanning near-field optical microscopy
Journal	Journal of Applied Physics
Authors	Huntington, S. T.		Author
	Nugent, K. A.		Author
	Roberts, A.		Author
	Mulvaney, P.		Author
	Lo, K. M.		Author
Year	1997 (July 15)	Volume	82
Issue	2
Publisher	AIP Publishing
DOI	doi:10.1063/1.365608Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	5087803	Long-form Identifier	mindat:1:5:5087803:9
GUID	0
Full Reference	Huntington, S. T., Nugent, K. A., Roberts, A., Mulvaney, P., Lo, K. M. (1997) Field characterization of a D-shaped optical fiber using scanning near-field optical microscopy. Journal of Applied Physics, 82 (2). 510-513 doi:10.1063/1.365608
Plain Text	Huntington, S. T., Nugent, K. A., Roberts, A., Mulvaney, P., Lo, K. M. (1997) Field characterization of a D-shaped optical fiber using scanning near-field optical microscopy. Journal of Applied Physics, 82 (2). 510-513 doi:10.1063/1.365608
In	(1997, July) Journal of Applied Physics Vol. 82 (2) AIP Publishing

	*Butler, D. J., Nugent, K. A., Roberts, A. (1994) Characterization of optical fibers using near‐field scanning optical microscopy. Journal of Applied Physics, 75 (6). 2753-2756 doi:10.1063/1.356212*
	Huntington, S. T., Mulvaney, P., Roberts, A., Nugent, K. A., Bazylenko, M. (1997) Atomic force microscopy for the determination of refractive index profiles of optical fibers and waveguides: A quantitative study. Journal of Applied Physics, 82 (6). 2730-2734 doi:10.1063/1.366103
	Butler, D. J., Horsfall, A., Nugent, K. A., Roberts, A., Bassett, I. M., Lo, K. M. (1995) Measurement of an elliptical fiber mode field using near‐field microscopy. Journal of Applied Physics, 77 (11). 5514-5517 doi:10.1063/1.359255
	Moar, P. N., Huntington, S. T., Katsifolis, J., Cahill, L. W., Roberts, A., Nugent, K. A. (1999) Fabrication, modeling, and direct evanescent field measurement of tapered optical fiber sensors. Journal of Applied Physics, 85 (7). 3395-3398 doi:10.1063/1.369695
	*Kryukov, A. E., Kim, Y.-K., Ketterson, J. B. (1997) Surface plasmon scanning near-field optical microscopy. Journal of Applied Physics, 82 (11). 5411-5415 doi:10.1063/1.365568*
	Safvi, S. A., Liu, J., Kuech, T. F. (1997) Spatial resolution of localized photoluminescence by near-field scanning optical microscopy. Journal of Applied Physics, 82 (11). 5352-5359 doi:10.1063/1.366303
	Huntington, S. T., Roberts, A., Nugent, K. A., Mulvaney, P., Bazylenko, M. (1998) Fibre and Waveguide Refractive Index Measurements with AFM Resolution. Japanese Journal of Applied Physics, 37. 62 doi:10.7567/jjaps.37s1.62
	Madsen, S., Bozhevolnyi, S. I., Birkelund, K., Müllenborn, M., Hvam, J. M., Grey, F. (1997) Oxidation of hydrogen-passivated silicon surfaces by scanning near-field optical lithography using uncoated and aluminum-coated fiber probes. Journal of Applied Physics, 82 (1). 49-53 doi:10.1063/1.365847
	Wei, P. K., Fann, W. S. (1998) Tip-sample distance regulation for near-field scanning optical microscopy using the bending angle of the tapered fiber probe. Journal of Applied Physics, 84 (9). 4655-4660 doi:10.1063/1.368706
	Huntington, S. T., Jarvis, S. P. (2003) Application of carbon nanotubes to topographical resolution enhancement of tapered fiber scanning near field optical microscopy probes. Review of Scientific Instruments, 74 (5). 2933-2935 doi:10.1063/1.1564275
	Yuan, Guangwei, Lear, Kevin L., Stephens, Matthew D., Dandy, David S. (2005) Characterization of a 90° waveguide bend using near-field scanning optical microscopy. Applied Physics Letters, 87 (19). 191107pp. doi:10.1063/1.2126135

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Huntington, S. T., Nugent, K. A., Roberts, A., Mulvaney, P., Lo, K. M. (1997) Field characterization of a D-shaped optical fiber using scanning near-field optical microscopy. Journal of Applied Physics, 82 (2). 510-513 doi:10.1063/1.365608

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