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Lee, J. H., Lee, S. H., Kim, W. S., Lee, H. J., Heo, J. N., Jeong, T. W., Baik, C. W., Park, S. H., Yu, SeGi, Park, J. B., Jin, Y. W., Kim, J. M., Lee, H. J., Moon, J. W., Yoo, M. A., Nam, J. W., Cho, S. H., Ha, J. S., Yoon, T. I., Park, J. H., Choe, D. H. (2006) Current degradation mechanism of single wall carbon nanotube emitters during field emission. Applied Physics Letters, 89 (25). 253115pp. doi:10.1063/1.2416250

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Reference TypeJournal (article/letter/editorial)
TitleCurrent degradation mechanism of single wall carbon nanotube emitters during field emission
JournalApplied Physics Letters
AuthorsLee, J. H.Author
Lee, S. H.Author
Kim, W. S.Author
Lee, H. J.Author
Heo, J. N.Author
Jeong, T. W.Author
Baik, C. W.Author
Park, S. H.Author
Yu, SeGiAuthor
Park, J. B.Author
Jin, Y. W.Author
Kim, J. M.Author
Lee, H. J.Author
Moon, J. W.Author
Yoo, M. A.Author
Nam, J. W.Author
Cho, S. H.Author
Ha, J. S.Author
Yoon, T. I.Author
Park, J. H.Author
Choe, D. H.Author
Year2006 (December 18)Volume89
Issue25
PublisherAIP Publishing
DOIdoi:10.1063/1.2416250Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8551509Long-form Identifiermindat:1:5:8551509:9
GUID0
Full ReferenceLee, J. H., Lee, S. H., Kim, W. S., Lee, H. J., Heo, J. N., Jeong, T. W., Baik, C. W., Park, S. H., Yu, SeGi, Park, J. B., Jin, Y. W., Kim, J. M., Lee, H. J., Moon, J. W., Yoo, M. A., Nam, J. W., Cho, S. H., Ha, J. S., Yoon, T. I., Park, J. H., Choe, D. H. (2006) Current degradation mechanism of single wall carbon nanotube emitters during field emission. Applied Physics Letters, 89 (25). 253115pp. doi:10.1063/1.2416250
Plain TextLee, J. H., Lee, S. H., Kim, W. S., Lee, H. J., Heo, J. N., Jeong, T. W., Baik, C. W., Park, S. H., Yu, SeGi, Park, J. B., Jin, Y. W., Kim, J. M., Lee, H. J., Moon, J. W., Yoo, M. A., Nam, J. W., Cho, S. H., Ha, J. S., Yoon, T. I., Park, J. H., Choe, D. H. (2006) Current degradation mechanism of single wall carbon nanotube emitters during field emission. Applied Physics Letters, 89 (25). 253115pp. doi:10.1063/1.2416250
In(2006, December) Applied Physics Letters Vol. 89 (25) AIP Publishing

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