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Matocha, Kevin, Tilak, Vinayak, Dunne, Greg (2007) Comparison of metal-oxide-semiconductor capacitors on c- and m-plane gallium nitride. Applied Physics Letters, 90 (12). 123511pp. doi:10.1063/1.2716309

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Reference TypeJournal (article/letter/editorial)
TitleComparison of metal-oxide-semiconductor capacitors on c- and m-plane gallium nitride
JournalApplied Physics Letters
AuthorsMatocha, KevinAuthor
Tilak, VinayakAuthor
Dunne, GregAuthor
Year2007 (March 19)Volume90
Issue12
PublisherAIP Publishing
DOIdoi:10.1063/1.2716309Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8553046Long-form Identifiermindat:1:5:8553046:9
GUID0
Full ReferenceMatocha, Kevin, Tilak, Vinayak, Dunne, Greg (2007) Comparison of metal-oxide-semiconductor capacitors on c- and m-plane gallium nitride. Applied Physics Letters, 90 (12). 123511pp. doi:10.1063/1.2716309
Plain TextMatocha, Kevin, Tilak, Vinayak, Dunne, Greg (2007) Comparison of metal-oxide-semiconductor capacitors on c- and m-plane gallium nitride. Applied Physics Letters, 90 (12). 123511pp. doi:10.1063/1.2716309
In(2007, March) Applied Physics Letters Vol. 90 (12) AIP Publishing

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Tilak, Vinayak, Batoni, Paolo, Jiang, Jie, Knobloch, Aaron (2007) Measurement of piezoelectric coefficient of gallium nitride using metal-insulator-semiconductor capacitors. Applied Physics Letters, 90 (4). 43508pp. doi:10.1063/1.2434180
Tilak, V., Matocha, K., Dunne, G. (2008) Fabrication and characterization of m-plane (1-100) GaN based metal-oxide-semiconductor capacitors. physica status solidi (c), 5 (6). 2019-2021 doi:10.1002/pssc.200778700
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Nayfeh, Osama M., Antoniadis, Dimitri A., Mantey, Kevin, Nayfeh, Munir H. (2007) Memory effects in metal-oxide-semiconductor capacitors incorporating dispensed highly monodisperse 1nm silicon nanoparticles. Applied Physics Letters, 90 (15). 153105pp. doi:10.1063/1.2721145
Tilak, Vinayak, Matocha, Kevin, Dunne, Greg, Allerstam, Fredrik, Sveinbjörnsson, Einar Ö. (2008) Scattering Mechanisms in Silicon Carbide MOSFETs with Gate Oxides Fabricated Using Sodium Enhanced Oxidation Technique. Materials Science Forum, 600. 687-690 doi:10.4028/www.scientific.net/msf.600-603.687
Matocha, Kevin, Chow, T. Paul, Gutmann, Ronald J. (2002) Gallium Nitride Metal-Insulator-Semiconductor Capacitors Using Low-Pressure Chemical Vapor Deposited Oxides. Materials Science Forum, 389. 1535pp. doi:10.4028/www.scientific.net/msf.389-393.1535
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Zhao, Han, Kim, Hyoung-Sub, Zhu, Feng, Zhang, Manhong, OK, Injo, Park, Sung Il, Yum, Jung Hwan, Lee, Jack C. (2007) Metal-oxide-semiconductor capacitors on GaAs with germanium nitride passivation layer. Applied Physics Letters, 91 (17). 172101pp. doi:10.1063/1.2795802
Fronheiser, Jody, Matocha, Kevin, Tilak, Vinayak, Feldman, Leonard C. (2009) 4H-SiC Oxide Characterization with SIMS Using a 13C Tracer. Materials Science Forum, 615. 513-516 doi:10.4028/www.scientific.net/msf.615-617.513
 
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