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Ogawa, Y., Minami, F., Abate, Yohannes, Leone, Stephen R. (2010) Nanometer-scale dielectric constant of Ge quantum dots using apertureless near-field scanning optical microscopy. Applied Physics Letters, 96 (6). 63107pp. doi:10.1063/1.3309692

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Reference TypeJournal (article/letter/editorial)
TitleNanometer-scale dielectric constant of Ge quantum dots using apertureless near-field scanning optical microscopy
JournalApplied Physics Letters
AuthorsOgawa, Y.Author
Minami, F.Author
Abate, YohannesAuthor
Leone, Stephen R.Author
Year2010 (February 8)Volume96
Issue6
PublisherAIP Publishing
DOIdoi:10.1063/1.3309692Search in ResearchGate
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Mindat Ref. ID8585502Long-form Identifiermindat:1:5:8585502:1
GUID0
Full ReferenceOgawa, Y., Minami, F., Abate, Yohannes, Leone, Stephen R. (2010) Nanometer-scale dielectric constant of Ge quantum dots using apertureless near-field scanning optical microscopy. Applied Physics Letters, 96 (6). 63107pp. doi:10.1063/1.3309692
Plain TextOgawa, Y., Minami, F., Abate, Yohannes, Leone, Stephen R. (2010) Nanometer-scale dielectric constant of Ge quantum dots using apertureless near-field scanning optical microscopy. Applied Physics Letters, 96 (6). 63107pp. doi:10.1063/1.3309692
In(2010, February) Applied Physics Letters Vol. 96 (6) AIP Publishing

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Abate, Yohannes, Schwartzberg, Adam, Strasser, Daniel, Leone, Stephen R. (2009) Nanometer-scale size dependent imaging of cetyl trimethyl ammonium bromide (CTAB) capped and uncapped gold nanoparticles by apertureless near-field optical microscopy. Chemical Physics Letters, 474. 146-152 doi:10.1016/j.cplett.2009.04.026
Hubert, Charles, Levy, Jeremy (1998) Nanometer-scale imaging of domains in ferroelectric thin films using apertureless near-field scanning optical microscopy. Applied Physics Letters, 73 (22). 3229-3231 doi:10.1063/1.122727
Kim, Zee Hwan, Liu, Bing, Leone, Stephen R. (2005) Nanometer-Scale Optical Imaging of Epitaxially Grown GaN and InN Islands Using Apertureless Near-Field Microscopy†. The Journal of Physical Chemistry B, 109 (17). 8503-8508 doi:10.1021/jp047425i
Stebounova, Larissa V., Romanyuk, Yaroslav E., Chen, Dongxue, Leone, Stephen R. (2007) Imaging of InGaN inhomogeneities using visible apertureless near-field scanning optical microscope. Journal of Applied Physics, 101 (12). 124306pp. doi:10.1063/1.2748871
Orlik, X. K., Labardi, M., Allegrini, M. (2000) Nanometer-scale observation of ferroelectric domains using an apertureless near-field optical microscope. Applied Physics Letters, 77 (13). 2042-2044 doi:10.1063/1.1311947
Formanek, F., De Wilde, Y., Aigouy, L. (2003) Imaging subwavelength holes using an apertureless near-field scanning optical microscope. Journal of Applied Physics, 93 (12). 9548-9552 doi:10.1063/1.1574178
Bek, Alpan, Vogelgesang, Ralf, Kern, Klaus (2005) Optical nonlinearity versus mechanical anharmonicity contrast in dynamic mode apertureless scanning near-field optical microscopy. Applied Physics Letters, 87 (16). 163115pp. doi:10.1063/1.2108125
Ogawa, Y., Toizumi, T., Minami, F., Baranov, A. V. (2011) Nanometer-scale mapping of the strain and Ge content of Ge/Si quantum dots using enhanced Raman scattering by the tip of an atomic force microscope. Physical Review B, 83 (8) doi:10.1103/physrevb.83.081302
Bachelot, R., Wurtz, G., Royer, P. (1998) An application of the apertureless scanning near-field optical microscopy: Imaging a GaAlAs laser diode in operation. Applied Physics Letters, 73 (23). 3333-3335 doi:10.1063/1.122760
Blodgett, David W., Spicer, James B. (1999) Detection of ultrasound using an apertureless near-field scanning optical microscope. Applied Physics Letters, 74 (24). 3735-3737 doi:10.1063/1.123237
Davis, R. C., Williams, C. C. (1996) Nanometer‐scale absorption spectroscopy by near‐field photodetection optical microscopy. Applied Physics Letters, 69 (9). 1179-1181 doi:10.1063/1.117403
 
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