Sakuraba, Y., Hirose, N., Oogane, M., Nakamura, T., Ando, Y., Takanashi, K. (2010) Co-concentration dependence of half-metallic properties in Co–Mn–Si epitaxial films. Applied Physics Letters, 96 (9). 92511pp. doi:10.1063/1.3330942
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Co-concentration dependence of half-metallic properties in Co–Mn–Si epitaxial films | ||
| Journal | Applied Physics Letters | ||
| Authors | Sakuraba, Y. | Author | |
| Hirose, N. | Author | ||
| Oogane, M. | Author | ||
| Nakamura, T. | Author | ||
| Ando, Y. | Author | ||
| Takanashi, K. | Author | ||
| Year | 2010 (March) | Volume | 96 |
| Issue | 9 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.3330942Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8586009 | Long-form Identifier | mindat:1:5:8586009:6 |
| GUID | 0 | ||
| Full Reference | Sakuraba, Y., Hirose, N., Oogane, M., Nakamura, T., Ando, Y., Takanashi, K. (2010) Co-concentration dependence of half-metallic properties in Co–Mn–Si epitaxial films. Applied Physics Letters, 96 (9). 92511pp. doi:10.1063/1.3330942 | ||
| Plain Text | Sakuraba, Y., Hirose, N., Oogane, M., Nakamura, T., Ando, Y., Takanashi, K. (2010) Co-concentration dependence of half-metallic properties in Co–Mn–Si epitaxial films. Applied Physics Letters, 96 (9). 92511pp. doi:10.1063/1.3330942 | ||
| In | (2010, March) Applied Physics Letters Vol. 96 (9) AIP Publishing | ||
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