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Lee, T F, McGill, T C (1973) Semiempirical calculation of deep levels: divacancy in Si. Journal of Physics C: Solid State Physics, 6 (23). 3438-3450 doi:10.1088/0022-3719/6/23/017

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Reference TypeJournal (article/letter/editorial)
TitleSemiempirical calculation of deep levels: divacancy in Si
JournalJournal of Physics C: Solid State Physics
AuthorsLee, T FAuthor
McGill, T CAuthor
Year1973 (November 27)Volume6
Issue23
PublisherIOP Publishing
DOIdoi:10.1088/0022-3719/6/23/017Search in ResearchGate
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Mindat Ref. ID8889005Long-form Identifiermindat:1:5:8889005:2
GUID0
Full ReferenceLee, T F, McGill, T C (1973) Semiempirical calculation of deep levels: divacancy in Si. Journal of Physics C: Solid State Physics, 6 (23). 3438-3450 doi:10.1088/0022-3719/6/23/017
Plain TextLee, T F, McGill, T C (1973) Semiempirical calculation of deep levels: divacancy in Si. Journal of Physics C: Solid State Physics, 6 (23). 3438-3450 doi:10.1088/0022-3719/6/23/017
In(1973, November) Journal of Physics C: Solid State Physics Vol. 6 (23) IOP Publishing

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Jaros, M, Ross, S F (1973) Calculations of impurity states in semiconductors: II. GaP:O. Journal of Physics C: Solid State Physics, 6 (23). 3451-3456 doi:10.1088/0022-3719/6/23/018
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Ramos, J G (1973) The longitudinal correlation function in the Heisenberg ferromagnet. Journal of Physics C: Solid State Physics, 6 (23). doi:10.1088/0022-3719/6/23/006
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