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Watanabe, Tomokatsu, Nakao, Yukiyasu, Fujihira, Keiko, Miura, Naruhisa, Tarui, Yoichiro, Imaizumi, Masayuki, Oomori, Tatsuo (2008) Observation of Crystalline Defects Causing pn Junction Reverse Leakage Current. Materials Science Forum, 600. 999-1002 doi:10.4028/www.scientific.net/msf.600-603.999

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Reference TypeJournal (article/letter/editorial)
TitleObservation of Crystalline Defects Causing pn Junction Reverse Leakage Current
JournalMaterials Science Forum
AuthorsWatanabe, TomokatsuAuthor
Nakao, YukiyasuAuthor
Fujihira, KeikoAuthor
Miura, NaruhisaAuthor
Tarui, YoichiroAuthor
Imaizumi, MasayukiAuthor
Oomori, TatsuoAuthor
Year2008 (September)Volume600
PublisherTrans Tech Publications, Ltd.
DOIdoi:10.4028/www.scientific.net/msf.600-603.999Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9867844Long-form Identifiermindat:1:5:9867844:0
GUID0
Full ReferenceWatanabe, Tomokatsu, Nakao, Yukiyasu, Fujihira, Keiko, Miura, Naruhisa, Tarui, Yoichiro, Imaizumi, Masayuki, Oomori, Tatsuo (2008) Observation of Crystalline Defects Causing pn Junction Reverse Leakage Current. Materials Science Forum, 600. 999-1002 doi:10.4028/www.scientific.net/msf.600-603.999
Plain TextWatanabe, Tomokatsu, Nakao, Yukiyasu, Fujihira, Keiko, Miura, Naruhisa, Tarui, Yoichiro, Imaizumi, Masayuki, Oomori, Tatsuo (2008) Observation of Crystalline Defects Causing pn Junction Reverse Leakage Current. Materials Science Forum, 600. 999-1002 doi:10.4028/www.scientific.net/msf.600-603.999
In(2008) Materials Science Forum Vol. 600. Trans Tech Publications, Ltd.

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