Reference Type | Journal (article/letter/editorial) |
---|
Title | Evaluation by resonant light scattering of ZnTe epitaxial layer deposited on GaAs |
---|
Journal | Applied Surface Science |
---|
Authors | Hongo, S. | Author |
---|
Kataoka, Y. | Author |
Urano, T. | Author |
Kanaji, T. | Author |
Year | 1990 (January) | Volume | 41 |
---|
Publisher | Elsevier BV |
---|
DOI | doi:10.1016/0169-4332(89)90114-1Search in ResearchGate |
---|
| Generate Citation Formats |
Mindat Ref. ID | 9894984 | Long-form Identifier | mindat:1:5:9894984:3 |
---|
|
GUID | 0 |
---|
Full Reference | Hongo, S., Kataoka, Y., Urano, T., Kanaji, T. (1990) Evaluation by resonant light scattering of ZnTe epitaxial layer deposited on GaAs. Applied Surface Science, 41. 522-525 doi:10.1016/0169-4332(89)90114-1 |
---|
Plain Text | Hongo, S., Kataoka, Y., Urano, T., Kanaji, T. (1990) Evaluation by resonant light scattering of ZnTe epitaxial layer deposited on GaAs. Applied Surface Science, 41. 522-525 doi:10.1016/0169-4332(89)90114-1 |
---|
In | (n.d.) Applied Surface Science Vol. 41. Elsevier BV |
---|
These are possibly similar items as determined by title/reference text matching only.