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Hyde, J.M., Cerezo, A., Setna, R.P., Warren, P.J., Smith, G.D.W. (1994) Lateral and depth scale calibration of the position sensitive atom probe. Applied Surface Science, 76. 382-391 doi:10.1016/0169-4332(94)90371-9

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Reference TypeJournal (article/letter/editorial)
TitleLateral and depth scale calibration of the position sensitive atom probe
JournalApplied Surface Science
AuthorsHyde, J.M.Author
Cerezo, A.Author
Setna, R.P.Author
Warren, P.J.Author
Smith, G.D.W.Author
Year1994 (March)Volume76
PublisherElsevier BV
DOIdoi:10.1016/0169-4332(94)90371-9Search in ResearchGate
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Mindat Ref. ID9897105Long-form Identifiermindat:1:5:9897105:5
GUID0
Full ReferenceHyde, J.M., Cerezo, A., Setna, R.P., Warren, P.J., Smith, G.D.W. (1994) Lateral and depth scale calibration of the position sensitive atom probe. Applied Surface Science, 76. 382-391 doi:10.1016/0169-4332(94)90371-9
Plain TextHyde, J.M., Cerezo, A., Setna, R.P., Warren, P.J., Smith, G.D.W. (1994) Lateral and depth scale calibration of the position sensitive atom probe. Applied Surface Science, 76. 382-391 doi:10.1016/0169-4332(94)90371-9
In(n.d.) Applied Surface Science Vol. 76. Elsevier BV

See Also

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Setna, R.P., Cerezo, A., Hyde, J.M., Smith, G.D.W. (1994) Atomic-scale characterisation of precipitation in copper-cobalt alloys. Applied Surface Science, 76. 203-212 doi:10.1016/0169-4332(94)90344-1
Setna, R.P., Hyde, J.M., Cerezo, A., Smith, G.D.W., Chisholm, M.F. (1993) Position sensitive atom probe study of the decomposition of a Cu-2.6at%Co alloy. Applied Surface Science, 67. 368-379 doi:10.1016/0169-4332(93)90340-h
Cerezo, A., Hyde, J.M., Miller, M.K., Beverini, G., Setna, R.P., Warren, P.J., Smith, G.D.W. (1992) New dimensions in atom-probe analysis. Surface Science, 266 (1). 481-493 doi:10.1016/0039-6028(92)91064-i
Cerezo, A., Godfrey, T.J., Hyde, J.M., Sijbrandij, S.J., Smith, G.D.W. (1994) Improvements in three-dimensional atom probe design. Applied Surface Science, 76. 374-381 doi:10.1016/0169-4332(94)90370-0
Cooper, A.S., Cerezo, A., Hyde, J.M., Mackenzie, R.A.D., Smith, G.D.W. (1994) Analysis of data from an optical atom probe. Applied Surface Science, 76. 409-415 doi:10.1016/0169-4332(94)90374-3
Grovenor, C.R.M., Smith, G.D.W., Cerezo, A., Liddle, J.A., Mackenzie, R.A.D., Warren, P.J., Setna, R.P., Hyde, J.M., Brown, J.E., Stark, I., Shollock, B.A. (1992) Ultra-high-resolution chemical analysis by field-ion microscopy, atom probe and position-sensitive atom-probe techniques. Ultramicroscopy, 47 (1). 199-211 doi:10.1016/0304-3991(92)90196-q
Hetherington, M.G., Cerezo, A., Hyde, J.M., Smith, G.D.W. (1992) Structural analysis with the position sensitive atom probe. Surface Science, 266 (1). 463-470 doi:10.1016/0039-6028(92)91062-g
Cerezo, A., Hyde, J.M., Sijbrandij, S.J., Smith, G.D.W. (1996) Data analysis in the optical PoSAP. Applied Surface Science, 94. 457-463 doi:10.1016/0169-4332(95)00410-6
Hyde, J.M., Cerezo, A., Miller, M.K., Smith, G.D.W. (1994) A critical comparison between experimental results and numerical simulations of phase separation in the Fe-Cr system. Applied Surface Science, 76. 233-241 doi:10.1016/0169-4332(94)90348-4
Sijbrandij, S.J., Cerezo, A., Smith, G.D.W. (1995) Improvements in the transmission of voltage evaporation pulses in the atom probe. Applied Surface Science, 87. 414-420 doi:10.1016/0169-4332(94)00492-7
Sijbrandij, S.J., Cerezo, A., Godfrey, T.J., Smith, G.D.W. (1996) Improvements in the mass resolution of the three-dimensional atom probe. Applied Surface Science, 94. 428-433 doi:10.1016/0169-4332(95)00406-8
 
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