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Sijbrandij, S.J., Cerezo, A., Godfrey, T.J., Smith, G.D.W. (1996) Improvements in the mass resolution of the three-dimensional atom probe. Applied Surface Science, 94. 428-433 doi:10.1016/0169-4332(95)00406-8

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Reference TypeJournal (article/letter/editorial)
TitleImprovements in the mass resolution of the three-dimensional atom probe
JournalApplied Surface Science
AuthorsSijbrandij, S.J.Author
Cerezo, A.Author
Godfrey, T.J.Author
Smith, G.D.W.Author
Year1996 (March)Volume94
PublisherElsevier BV
DOIdoi:10.1016/0169-4332(95)00406-8Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9898155Long-form Identifiermindat:1:5:9898155:7
GUID0
Full ReferenceSijbrandij, S.J., Cerezo, A., Godfrey, T.J., Smith, G.D.W. (1996) Improvements in the mass resolution of the three-dimensional atom probe. Applied Surface Science, 94. 428-433 doi:10.1016/0169-4332(95)00406-8
Plain TextSijbrandij, S.J., Cerezo, A., Godfrey, T.J., Smith, G.D.W. (1996) Improvements in the mass resolution of the three-dimensional atom probe. Applied Surface Science, 94. 428-433 doi:10.1016/0169-4332(95)00406-8
In(n.d.) Applied Surface Science Vol. 94. Elsevier BV

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Cerezo, A., Godfrey, T.J., Hyde, J.M., Sijbrandij, S.J., Smith, G.D.W. (1994) Improvements in three-dimensional atom probe design. Applied Surface Science, 76. 374-381 doi:10.1016/0169-4332(94)90370-0
Sijbrandij, S.J., Cerezo, A., Smith, G.D.W. (1995) Improvements in the transmission of voltage evaporation pulses in the atom probe. Applied Surface Science, 87. 414-420 doi:10.1016/0169-4332(94)00492-7
Cerezo, A., Hyde, J.M., Sijbrandij, S.J., Smith, G.D.W. (1996) Data analysis in the optical PoSAP. Applied Surface Science, 94. 457-463 doi:10.1016/0169-4332(95)00410-6
Cooper, A.S., Cerezo, A., Hyde, J.M., Mackenzie, R.A.D., Smith, G.D.W. (1994) Analysis of data from an optical atom probe. Applied Surface Science, 76. 409-415 doi:10.1016/0169-4332(94)90374-3
Hyde, J.M., Cerezo, A., Setna, R.P., Warren, P.J., Smith, G.D.W. (1994) Lateral and depth scale calibration of the position sensitive atom probe. Applied Surface Science, 76. 382-391 doi:10.1016/0169-4332(94)90371-9
Grennan-Heaven, N., Cerezo, A., Godfrey, T.J., Smith, G.D.W. (2007) Optimisation of a scanning atom probe with improved mass resolution using post deceleration. Ultramicroscopy, 107 (9). 705-712 doi:10.1016/j.ultramic.2007.02.007
Miller, M.K., Smith, G.D.W. (1995) Atom probe analysis of interfacial segregation. Applied Surface Science, 87. 243-250 doi:10.1016/0169-4332(94)00493-5
Athenstaedt, W., Leisch, M. (1996) The segregation behaviour of a Pt90Rh10 alloy studied with a three-dimensional atom-probe. Applied Surface Science, 94. 403-408 doi:10.1016/0169-4332(95)00525-0
Setna, R.P., Hyde, J.M., Cerezo, A., Smith, G.D.W., Chisholm, M.F. (1993) Position sensitive atom probe study of the decomposition of a Cu-2.6at%Co alloy. Applied Surface Science, 67. 368-379 doi:10.1016/0169-4332(93)90340-h
Setna, R.P., Cerezo, A., Hyde, J.M., Smith, G.D.W. (1994) Atomic-scale characterisation of precipitation in copper-cobalt alloys. Applied Surface Science, 76. 203-212 doi:10.1016/0169-4332(94)90344-1
Miller, M.K., Hyde, J.M., Cerezo, A., Smith, G.D.W. (1995) Comparison of low temperature decomposition in Feî—¸Cr and duplex stainless steels. Applied Surface Science, 87. 323-328 doi:10.1016/0169-4332(95)00497-1
 
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