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Pfister, M., Johnson, M.B., Alvarado, S.F., Salemink, H.W.M., Marti, U., Martin, D., Morier-Genoud, F., Reinhart, F.K. (1996) Surface and subsurface imaging of indium in InGaAs by scanning tunneling microscopy. Applied Surface Science, 104. 516-521 doi:10.1016/s0169-4332(96)00196-1

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Reference TypeJournal (article/letter/editorial)
TitleSurface and subsurface imaging of indium in InGaAs by scanning tunneling microscopy
JournalApplied Surface Science
AuthorsPfister, M.Author
Johnson, M.B.Author
Alvarado, S.F.Author
Salemink, H.W.M.Author
Marti, U.Author
Martin, D.Author
Morier-Genoud, F.Author
Reinhart, F.K.Author
Year1996 (September)Volume104
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(96)00196-1Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9898794Long-form Identifiermindat:1:5:9898794:0
GUID0
Full ReferencePfister, M., Johnson, M.B., Alvarado, S.F., Salemink, H.W.M., Marti, U., Martin, D., Morier-Genoud, F., Reinhart, F.K. (1996) Surface and subsurface imaging of indium in InGaAs by scanning tunneling microscopy. Applied Surface Science, 104. 516-521 doi:10.1016/s0169-4332(96)00196-1
Plain TextPfister, M., Johnson, M.B., Alvarado, S.F., Salemink, H.W.M., Marti, U., Martin, D., Morier-Genoud, F., Reinhart, F.K. (1996) Surface and subsurface imaging of indium in InGaAs by scanning tunneling microscopy. Applied Surface Science, 104. 516-521 doi:10.1016/s0169-4332(96)00196-1
In(n.d.) Applied Surface Science Vol. 104. Elsevier BV

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Pfister, M., Johnson, M. B., Alvarado, S. F., Salemink, H. W. M., Marti, U., Martin, D., Morier‐Genoud, F., Reinhart, F. K. (1995) Indium distribution in InGaAs quantum wires observed with the scanning tunneling microscope. Applied Physics Letters, 67 (10). 1459-1461 doi:10.1063/1.114494
Molina, S.I, Araujo, D, Rojas, T.C, Garcia, R, Morier-Genoud, F, Marti, U, Reinhart, F.K (1999) Transmission electron microscopy study of InGaAs/InP superlattices grown on V-shaped surface InP substrates. Applied Surface Science, 144. 488-491 doi:10.1016/s0169-4332(98)00846-0
Pfister, M., Johnson, M. B., Alvarado, S. F., Salemink, H. W. M., Marti, U., Martin, D., Morier‐Genoud, F., Reinhart, F. K. (1994) Atomic structure and luminescence excitation of GaAs/(AlAs)n(GaAs)mquantum wires with the scanning tunneling microscope. Applied Physics Letters, 65 (9). 1168-1170 doi:10.1063/1.112978
Bruls, D.M., Koenraad, P.M., Hopkinson, M., Wolter, J.H., Salemink, H.W.M. (2002) Determination of the outward relaxation of cleaved strained InAs structures by scanning tunneling microscopy. Applied Surface Science, 190. 258-263 doi:10.1016/s0169-4332(01)00861-3
Springholz, G. (1997) Strain contrast in scanning tunneling microscopy imaging of subsurface dislocations in lattice-mismatched heteroepitaxy. Applied Surface Science, 112. 12-22 doi:10.1016/s0169-4332(96)00999-3
Lew, A.Y., Yan, C.H., Tu, C.W., Yu, E.T. (1996) Characterization of arsenide/phosphide heterostructure interfaces by scanning tunneling microscopy. Applied Surface Science, 104. 522-528 doi:10.1016/s0169-4332(96)00197-3
Lin, X.F., Chizhov, I., Mai, H.A., Willis, R.F. (1996) Scanning tunneling spectroscopy examination of surface electronic structures of surface. Applied Surface Science, 104. 223-227 doi:10.1016/s0169-4332(96)00148-1
Bunk, O., Falkenberg, G., Seehofer, L., Zeysing, J.H., Johnson, R.L., Nielsen, M., Feidenhans'l, R., Landemark, E. (1998) Structure determination of the indium induced Si(001)-(4 × 3) reconstruction by surface X-ray diffraction and scanning tunneling microscopy. Applied Surface Science, 123. 104-110 doi:10.1016/s0169-4332(97)00472-8
Golan, G., Pitt, C.W. (1996) Novel imaging method in scanning acoustic microscopy for thin films. Applied Surface Science, 106. 491-497 doi:10.1016/s0169-4332(96)00397-2
Yao, Takafumi, Shinabe, Shinji, Yoshimura, Masamichi (1996) Atomistic study of the formation process of Ni silicide on the Si(111)-7×7 surface with scanning tunneling microscopy. Applied Surface Science, 104. 213-217 doi:10.1016/s0169-4332(96)00146-8
Klusek, Z (1997) Energetic heterogeneity studies of the oxidized graphite surface by scanning tunneling microscopy and photoelectron spectroscopy. Applied Surface Science, 108. 405-414 doi:10.1016/s0169-4332(96)00682-4
 
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