Reference Type | Journal (article/letter/editorial) |
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Title | Characterization of arsenide/phosphide heterostructure interfaces by scanning tunneling microscopy |
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Journal | Applied Surface Science |
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Authors | Lew, A.Y. | Author |
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Yan, C.H. | Author |
Tu, C.W. | Author |
Yu, E.T. | Author |
Year | 1996 (September) | Volume | 104 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/s0169-4332(96)00197-3Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9898795 | Long-form Identifier | mindat:1:5:9898795:9 |
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GUID | 0 |
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Full Reference | Lew, A.Y., Yan, C.H., Tu, C.W., Yu, E.T. (1996) Characterization of arsenide/phosphide heterostructure interfaces by scanning tunneling microscopy. Applied Surface Science, 104. 522-528 doi:10.1016/s0169-4332(96)00197-3 |
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Plain Text | Lew, A.Y., Yan, C.H., Tu, C.W., Yu, E.T. (1996) Characterization of arsenide/phosphide heterostructure interfaces by scanning tunneling microscopy. Applied Surface Science, 104. 522-528 doi:10.1016/s0169-4332(96)00197-3 |
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In | (n.d.) Applied Surface Science Vol. 104. Elsevier BV |
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