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Lin, Yuan, Lin, Ruifeng, Wang, Weibo, Xiao, Xurui (1999) Characterization of TiO2 nanocrystalline thin film by scanning tunneling microscopy and scanning tunneling spectroscopy. Applied Surface Science, 143. 169-173 doi:10.1016/s0169-4332(98)00928-3

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Reference TypeJournal (article/letter/editorial)
TitleCharacterization of TiO2 nanocrystalline thin film by scanning tunneling microscopy and scanning tunneling spectroscopy
JournalApplied Surface Science
AuthorsLin, YuanAuthor
Lin, RuifengAuthor
Wang, WeiboAuthor
Xiao, XuruiAuthor
Year1999 (April)Volume143
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(98)00928-3Search in ResearchGate
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Mindat Ref. ID9901096Long-form Identifiermindat:1:5:9901096:2
GUID0
Full ReferenceLin, Yuan, Lin, Ruifeng, Wang, Weibo, Xiao, Xurui (1999) Characterization of TiO2 nanocrystalline thin film by scanning tunneling microscopy and scanning tunneling spectroscopy. Applied Surface Science, 143. 169-173 doi:10.1016/s0169-4332(98)00928-3
Plain TextLin, Yuan, Lin, Ruifeng, Wang, Weibo, Xiao, Xurui (1999) Characterization of TiO2 nanocrystalline thin film by scanning tunneling microscopy and scanning tunneling spectroscopy. Applied Surface Science, 143. 169-173 doi:10.1016/s0169-4332(98)00928-3
In(n.d.) Applied Surface Science Vol. 143. Elsevier BV

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