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Sommerhalter, Ch, Matthes, Th.W, Boneberg, J, Lux-Steiner, M.Ch, Leiderer, P (1999) Investigation of acceptors in p-type WS2 by standard and photo-assisted scanning tunneling microscopy/spectroscopy. Applied Surface Science, 144. 564-569 doi:10.1016/s0169-4332(98)00866-6

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Reference TypeJournal (article/letter/editorial)
TitleInvestigation of acceptors in p-type WS2 by standard and photo-assisted scanning tunneling microscopy/spectroscopy
JournalApplied Surface Science
AuthorsSommerhalter, ChAuthor
Matthes, Th.WAuthor
Boneberg, JAuthor
Lux-Steiner, M.ChAuthor
Leiderer, PAuthor
Year1999 (April)Volume144
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(98)00866-6Search in ResearchGate
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Mindat Ref. ID9901223Long-form Identifiermindat:1:5:9901223:4
GUID0
Full ReferenceSommerhalter, Ch, Matthes, Th.W, Boneberg, J, Lux-Steiner, M.Ch, Leiderer, P (1999) Investigation of acceptors in p-type WS2 by standard and photo-assisted scanning tunneling microscopy/spectroscopy. Applied Surface Science, 144. 564-569 doi:10.1016/s0169-4332(98)00866-6
Plain TextSommerhalter, Ch, Matthes, Th.W, Boneberg, J, Lux-Steiner, M.Ch, Leiderer, P (1999) Investigation of acceptors in p-type WS2 by standard and photo-assisted scanning tunneling microscopy/spectroscopy. Applied Surface Science, 144. 564-569 doi:10.1016/s0169-4332(98)00866-6
In(n.d.) Applied Surface Science Vol. 144. Elsevier BV

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Matthes, Th.W., Sommerhalter, Ch., Rettenberger, A., Böhmisch, M., Boneberg, J., Lux-Steiner, M.Ch., Leiderer, P. (1998) Investigation of photoinduced tunneling current and local surface photovoltage by STM. Applied Surface Science, 123. 187-191 doi:10.1016/s0169-4332(97)00480-7
Sommerhalter, Ch, Glatzel, Th, Matthes, Th.W, Jäger-Waldau, A, Lux-Steiner, M.Ch (2000) Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces. Applied Surface Science, 157. 263-268 doi:10.1016/s0169-4332(99)00537-1
Sommerhalter, Ch., Sadewasser, S., Glatzel, Th., Matthes, Th.W., Jäger-Waldau, A., Lux-Steiner, M.Ch. (2001) Kelvin probe force microscopy for the characterization of semiconductor surfaces in chalcopyrite solar cells. Surface Science, 482. 1362-1367 doi:10.1016/s0039-6028(01)00878-0
Rettenberger, A, Bruker, P, Metzler, M, Mugele, F, Matthes, Th.W, Böhmisch, M, Boneberg, J, Friemelt, K, Leiderer, P (1998) STM investigation of the island growth of gold on WS2 and WSe2. Surface Science, 402. 409-412 doi:10.1016/s0039-6028(97)00961-8
Burmeister, F, Badowsky, W, Braun, T, Wieprich, S, Boneberg, J, Leiderer, P (1999) Colloid monolayer lithography-A flexible approach for nanostructuring of surfaces. Applied Surface Science, 144. 461-466 doi:10.1016/s0169-4332(98)00840-x
Glatzel, Th, Sadewasser, S, Lux-Steiner, M.Ch (2003) Amplitude or frequency modulation-detection in Kelvin probe force microscopy. Applied Surface Science, 210. 84-89 doi:10.1016/s0169-4332(02)01484-8
Lin, Yuan, Lin, Ruifeng, Wang, Weibo, Xiao, Xurui (1999) Characterization of TiO2 nanocrystalline thin film by scanning tunneling microscopy and scanning tunneling spectroscopy. Applied Surface Science, 143. 169-173 doi:10.1016/s0169-4332(98)00928-3
Sommerhalter, Ch., Matthes, Th. W., Glatzel, Th., Jäger-Waldau, A., Lux-Steiner, M. Ch. (1999) High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy. Applied Physics Letters, 75 (2). 286-288 doi:10.1063/1.124357
Jäger-Waldau, A., Lux-Steiner, M.Ch., Jäger-Waldau, G., Bucher, E. (1993) WS2 thin films prepared by sulphurization. Applied Surface Science, 70. 731-736 doi:10.1016/0169-4332(93)90611-e
Sadewasser, S., Glatzel, Th., Shikler, R., Rosenwaks, Y., Lux-Steiner, M.Ch. (2003) Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation. Applied Surface Science, 210. 32-36 doi:10.1016/s0169-4332(02)01475-7
Sommerhalter, Ch., Pietzak, B., Lux-Steiner, M.Ch., Nuber, B., Reuther, U., Hirsch, A. (1999) Noncontact UHV-AFM investigations of the growth of C59N films on layered materials. Surface Science, 433. 486-490 doi:10.1016/s0039-6028(99)00118-1
 
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