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Sommerhalter, Ch, Glatzel, Th, Matthes, Th.W, Jäger-Waldau, A, Lux-Steiner, M.Ch (2000) Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces. Applied Surface Science, 157. 263-268 doi:10.1016/s0169-4332(99)00537-1

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Reference TypeJournal (article/letter/editorial)
TitleKelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces
JournalApplied Surface Science
AuthorsSommerhalter, ChAuthor
Glatzel, ThAuthor
Matthes, Th.WAuthor
Jäger-Waldau, AAuthor
Lux-Steiner, M.ChAuthor
Year2000 (April)Volume157
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(99)00537-1Search in ResearchGate
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Mindat Ref. ID9901802Long-form Identifiermindat:1:5:9901802:5
GUID0
Full ReferenceSommerhalter, Ch, Glatzel, Th, Matthes, Th.W, Jäger-Waldau, A, Lux-Steiner, M.Ch (2000) Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces. Applied Surface Science, 157. 263-268 doi:10.1016/s0169-4332(99)00537-1
Plain TextSommerhalter, Ch, Glatzel, Th, Matthes, Th.W, Jäger-Waldau, A, Lux-Steiner, M.Ch (2000) Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces. Applied Surface Science, 157. 263-268 doi:10.1016/s0169-4332(99)00537-1
In(n.d.) Applied Surface Science Vol. 157. Elsevier BV

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Sommerhalter, Ch., Sadewasser, S., Glatzel, Th., Matthes, Th.W., Jäger-Waldau, A., Lux-Steiner, M.Ch. (2001) Kelvin probe force microscopy for the characterization of semiconductor surfaces in chalcopyrite solar cells. Surface Science, 482. 1362-1367 doi:10.1016/s0039-6028(01)00878-0
Sommerhalter, Ch., Matthes, Th. W., Glatzel, Th., Jäger-Waldau, A., Lux-Steiner, M. Ch. (1999) High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy. Applied Physics Letters, 75 (2). 286-288 doi:10.1063/1.124357
Glatzel, Th, Sadewasser, S, Lux-Steiner, M.Ch (2003) Amplitude or frequency modulation-detection in Kelvin probe force microscopy. Applied Surface Science, 210. 84-89 doi:10.1016/s0169-4332(02)01484-8
Sadewasser, S., Glatzel, Th., Shikler, R., Rosenwaks, Y., Lux-Steiner, M.Ch. (2003) Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation. Applied Surface Science, 210. 32-36 doi:10.1016/s0169-4332(02)01475-7
Sommerhalter, Ch, Matthes, Th.W, Boneberg, J, Lux-Steiner, M.Ch, Leiderer, P (1999) Investigation of acceptors in p-type WS2 by standard and photo-assisted scanning tunneling microscopy/spectroscopy. Applied Surface Science, 144. 564-569 doi:10.1016/s0169-4332(98)00866-6
Matthes, Th.W., Sommerhalter, Ch., Rettenberger, A., Böhmisch, M., Boneberg, J., Lux-Steiner, M.Ch., Leiderer, P. (1998) Investigation of photoinduced tunneling current and local surface photovoltage by STM. Applied Surface Science, 123. 187-191 doi:10.1016/s0169-4332(97)00480-7
Jäger-Waldau, A., Lux-Steiner, M.Ch., Jäger-Waldau, G., Bucher, E. (1993) WS2 thin films prepared by sulphurization. Applied Surface Science, 70. 731-736 doi:10.1016/0169-4332(93)90611-e
Shikler, R, Rosenwaks, Y (2000) Kelvin probe force microscopy using near-field optical tips. Applied Surface Science, 157. 256-262 doi:10.1016/s0169-4332(99)00536-x
Glatzel, Th., Marrón, D. Fuertes, Schedel-Niedrig, Th., Sadewasser, S., Lux-Steiner, M. Ch. (2002) CuGaSe2 solar cell cross section studied by Kelvin probe force microscopy in ultrahigh vacuum. Applied Physics Letters, 81 (11). 2017-2019 doi:10.1063/1.1506205
Jäger-Waldau, A., Lux-Steiner, M.Ch., Bucher, E., Scandella, L., Schumacher, A., Prins, R. (1993) MoS2 thin films prepared by sulphurization. Applied Surface Science, 65. 465-472 doi:10.1016/0169-4332(93)90703-e
Sadewasser, S., Glatzel, Th., Rusu, M., Jäger-Waldau, A., Lux-Steiner, M. Ch. (2002) High-resolution work function imaging of single grains of semiconductor surfaces. Applied Physics Letters, 80 (16). 2979-2981 doi:10.1063/1.1471375
 
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