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Shikler, R, Rosenwaks, Y (2000) Kelvin probe force microscopy using near-field optical tips. Applied Surface Science, 157. 256-262 doi:10.1016/s0169-4332(99)00536-x

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Reference TypeJournal (article/letter/editorial)
TitleKelvin probe force microscopy using near-field optical tips
JournalApplied Surface Science
AuthorsShikler, RAuthor
Rosenwaks, YAuthor
Year2000 (April)Volume157
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(99)00536-xSearch in ResearchGate
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Mindat Ref. ID9901801Long-form Identifiermindat:1:5:9901801:6
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Full ReferenceShikler, R, Rosenwaks, Y (2000) Kelvin probe force microscopy using near-field optical tips. Applied Surface Science, 157. 256-262 doi:10.1016/s0169-4332(99)00536-x
Plain TextShikler, R, Rosenwaks, Y (2000) Kelvin probe force microscopy using near-field optical tips. Applied Surface Science, 157. 256-262 doi:10.1016/s0169-4332(99)00536-x
In(n.d.) Applied Surface Science Vol. 157. Elsevier BV

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Sadewasser, S., Glatzel, Th., Shikler, R., Rosenwaks, Y., Lux-Steiner, M.Ch. (2003) Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation. Applied Surface Science, 210. 32-36 doi:10.1016/s0169-4332(02)01475-7
Rosenwaks, Y., Shikler, R., Glatzel, Th., Sadewasser, S. (2004) Kelvin probe force microscopy of semiconductor surface defects. Physical Review B, 70 (8) doi:10.1103/physrevb.70.085320
Lévêque, G, Girard, P, Skouri, E, Yarekha, D (2000) Measurements of electric potential in a laser diode by Kelvin Probe Force Microscopy. Applied Surface Science, 157. 251-255 doi:10.1016/s0169-4332(99)00535-8
Meoded, T., Shikler, R., Fried, N., Rosenwaks, Y. (1999) Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy. Applied Physics Letters, 75 (16). 2435-2437 doi:10.1063/1.125039
Bhushan, Bharat, Goldade, Anton V (2000) Measurements and analysis of surface potential change during wear of single-crystal silicon (100) at ultralow loads using Kelvin probe microscopy. Applied Surface Science, 157. 373-381 doi:10.1016/s0169-4332(99)00553-x
Sommerhalter, Ch, Glatzel, Th, Matthes, Th.W, Jäger-Waldau, A, Lux-Steiner, M.Ch (2000) Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces. Applied Surface Science, 157. 263-268 doi:10.1016/s0169-4332(99)00537-1
Shikler, R., Rosenwaks, Y. (2000) Near-field surface photovoltage. Applied Physics Letters, 77 (6). 836-838 doi:10.1063/1.1306916
Shikler, R., Rosenwaks, Y. (2010) Response to “Comment on ‘Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy’ ” [Appl. Phys. Lett. 96, 216101 (2010)]. Applied Physics Letters, 96 (21). 216102pp. doi:10.1063/1.3431744
Shikler, R., Fried, N., Meoded, T., Rosenwaks, Y. (2000) Measuring minority-carrier diffusion length using a Kelvin probe force microscope. Physical Review B, 61 (16) 11041-11046 doi:10.1103/physrevb.61.11041
Shikler, R., Meoded, T., Fried, N., Rosenwaks, Y. (1999) Potential imaging of operating light-emitting devices using Kelvin force microscopy. Applied Physics Letters, 74 (20). 2972-2974 doi:10.1063/1.123983
Saraf, S., Rosenwaks, Y. (2005) Local measurement of semiconductor band bending and surface charge using Kelvin probe force microscopy. Surface Science, 574 (2). doi:10.1016/j.susc.2004.10.042
 
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