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Srinivas, V, Kasiviswanathan, S, Barua, Pranabesh, Mathur, B.K (1999) Surface characterization of Al–Cu–Fe thin films by scanning tunneling microscopy and scanning tunneling spectroscopy. Applied Surface Science, 147. 140-145 doi:10.1016/s0169-4332(99)00105-1

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Reference TypeJournal (article/letter/editorial)
TitleSurface characterization of Al–Cu–Fe thin films by scanning tunneling microscopy and scanning tunneling spectroscopy
JournalApplied Surface Science
AuthorsSrinivas, VAuthor
Kasiviswanathan, SAuthor
Barua, PranabeshAuthor
Mathur, B.KAuthor
Year1999 (May)Volume147
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(99)00105-1Search in ResearchGate
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Mindat Ref. ID9901350Long-form Identifiermindat:1:5:9901350:7
GUID0
Full ReferenceSrinivas, V, Kasiviswanathan, S, Barua, Pranabesh, Mathur, B.K (1999) Surface characterization of Al–Cu–Fe thin films by scanning tunneling microscopy and scanning tunneling spectroscopy. Applied Surface Science, 147. 140-145 doi:10.1016/s0169-4332(99)00105-1
Plain TextSrinivas, V, Kasiviswanathan, S, Barua, Pranabesh, Mathur, B.K (1999) Surface characterization of Al–Cu–Fe thin films by scanning tunneling microscopy and scanning tunneling spectroscopy. Applied Surface Science, 147. 140-145 doi:10.1016/s0169-4332(99)00105-1
In(n.d.) Applied Surface Science Vol. 147. Elsevier BV

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