Reference Type | Journal (article/letter/editorial) |
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Title | XPS study of GaInP on GaAs interface |
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Journal | Applied Surface Science |
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Authors | Dehaese, O. | Author |
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Wallart, X. | Author |
Schuler, O. | Author |
Mollot, F. | Author |
Year | 1998 (January) | Volume | 123 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/s0169-4332(97)00534-5Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9900017 | Long-form Identifier | mindat:1:5:9900017:8 |
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GUID | 0 |
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Full Reference | Dehaese, O., Wallart, X., Schuler, O., Mollot, F. (1998) XPS study of GaInP on GaAs interface. Applied Surface Science, 123. 523-527 doi:10.1016/s0169-4332(97)00534-5 |
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Plain Text | Dehaese, O., Wallart, X., Schuler, O., Mollot, F. (1998) XPS study of GaInP on GaAs interface. Applied Surface Science, 123. 523-527 doi:10.1016/s0169-4332(97)00534-5 |
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In | (n.d.) Applied Surface Science Vol. 123. Elsevier BV |
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